X-Ray Topography Using Synchrotron Radiation
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X-ray diffraction topography is a widely used method to study crystal lattice defects by visualization. The properties of synchrotron radiation relevant to topography methods extend the possibilities of investigations. These properties are the following: a high intensity, a broad spectral range, a natural collimation, a linear polarization in the horizontal plane, and a pulsed time structure. The application of synchrotron radiation to X-ray topographic studies is described and some recent examples of experiments are presented.
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