Title variants
Languages of publication
Abstracts
X-ray diffraction topography is a widely used method to study crystal lattice defects by visualization. The properties of synchrotron radiation relevant to topography methods extend the possibilities of investigations. These properties are the following: a high intensity, a broad spectral range, a natural collimation, a linear polarization in the horizontal plane, and a pulsed time structure. The application of synchrotron radiation to X-ray topographic studies is described and some recent examples of experiments are presented.
Journal
Year
Volume
Issue
Pages
545-552
Physical description
Dates
published
1994-10
Contributors
author
- Institute of Atomic Energy, 05-400 Otwock-Świerk, Poland
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z409kz