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1994 | 86 | 4 | 545-552
Article title

X-Ray Topography Using Synchrotron Radiation

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Content
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Languages of publication
EN
Abstracts
EN
X-ray diffraction topography is a widely used method to study crystal lattice defects by visualization. The properties of synchrotron radiation relevant to topography methods extend the possibilities of investigations. These properties are the following: a high intensity, a broad spectral range, a natural collimation, a linear polarization in the horizontal plane, and a pulsed time structure. The application of synchrotron radiation to X-ray topographic studies is described and some recent examples of experiments are presented.
Keywords
EN
Year
Volume
86
Issue
4
Pages
545-552
Physical description
Dates
published
1994-10
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z409kz
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