X-Ray Topography Using Synchrotron Radiation

• Authors: K. Wieteska
• Languages of publication: EN

Abstracts

EN

X-ray diffraction topography is a widely used method to study crystal lattice defects by visualization. The properties of synchrotron radiation relevant to topography methods extend the possibilities of investigations. These properties are the following: a high intensity, a broad spectral range, a natural collimation, a linear polarization in the horizontal plane, and a pulsed time structure. The application of synchrotron radiation to X-ray topographic studies is described and some recent examples of experiments are presented.

Keywords

EN

07.85.+n   61.10.Lx  

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1994
• Volume: 86
• Issue: 4
• Pages: 545-552

Dates

published

1994-10