Application of Synchrotron X-Ray Topography to the Study of Materials
Languages of publication
In this article, we review the application of synchrotron X-ray topography to the study of the defect structure of materials. Following a discussion of source and detector requirements, in situ dynamic, stroboscopic, and ultra-high strain sensitivity experiments are discussed in the context of the new, third generation, synchrotron radiation sources. The intensity and continuous spectrum of synchrotron radiation is particularly important but further use of the time structure and polarization is timely. The future potential of the technique is discussed in the context of recent results at the European Synchrotron Radiation Facility in Grenoble.
Publication order reference