PL EN


Preferences help
enabled [disable] Abstract
Number of results
1994 | 86 | 4 | 537-544
Article title

Application of Synchrotron X-Ray Topography to the Study of Materials

Authors
Content
Title variants
Languages of publication
EN
Abstracts
EN
In this article, we review the application of synchrotron X-ray topography to the study of the defect structure of materials. Following a discussion of source and detector requirements, in situ dynamic, stroboscopic, and ultra-high strain sensitivity experiments are discussed in the context of the new, third generation, synchrotron radiation sources. The intensity and continuous spectrum of synchrotron radiation is particularly important but further use of the time structure and polarization is timely. The future potential of the technique is discussed in the context of recent results at the European Synchrotron Radiation Facility in Grenoble.
Keywords
EN
Publisher

Year
Volume
86
Issue
4
Pages
537-544
Physical description
Dates
published
1994-10
Contributors
author
  • Department of Physics, University of Durham South Road, Durham, DH1 3LE, Great Britain
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z408kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.