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1994 | 86 | 4 | 463-476
Article title

Characterization of Concave-Curved Spectrometers for 2D X-Ray Optics

Content
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Languages of publication
EN
Abstracts
EN
A procedure for calculating X-ray intensity profiles analytically for various X-ray diffraction geometries has been developed, which takes into account the misalignment, the solid angle factor, the effects of convergence and/or divergence of the diffracted X-rays. The approach is applicable to X-ray optics with either a point source or a quasi-parallel beam. Moreover, using this procedure allows one to calculate the magnified image from a plasma source, the intensity profiles of topographs of bent crystals, and the spectral resolution of various focusing geometries. Several examples are presented to demonstrate the applications of this procedure. Using non-dispersive and dispersive double-crystal spectrometers, rocking curves were measured for singly and doubly bent crystals. The agreement was satisfactory with the X-ray dynamic theory of bent crystals. Furthermore, we have also extended the study of X-ray optics to include the crystal anisotropic effects. The anisotropic elasticity theory is applied to bend crystals for calculating the diffracting region on the crystal surface. The anticlastic curvature effects are analytically demonstrated with respect to the crystals' diffracting area.
Keywords
EN
Publisher

Year
Volume
86
Issue
4
Pages
463-476
Physical description
Dates
published
1994-10
Contributors
  • X-Ray Optics Group of the Max-Planck-Gesellschaft at the Friedrich-Schiller University of Jena, 07743 Jena, Germany
author
  • X-Ray Optics Group of the Max-Planck-Gesellschaft at the Friedrich-Schiller University of Jena, 07743 Jena, Germany
author
  • X-Ray Optics Group of the Max-Planck-Gesellschaft at the Friedrich-Schiller University of Jena, 07743 Jena, Germany
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z402kz
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