Free-Electron Analysis of Optical Properties of Thermally Evaporated Gold Films

• Authors: N. El-Kadry
• Languages of publication: EN

Abstracts

EN

Gold films of thicknesses 150-300 Å were deposited on quartz substrata using vacuum evaporation technique. Spectrophotometric measurements of transmission T and reflection R at normal incidence were performed in the range 0.4-3.0 µm. The real and imaginary parts of the complex refractive index ñ were determined using a developer algorithm bashed on Murmann's exact equations. The accuracy in the determined n and k was found to be ±6.0% and ±1.6%, respectively. The dispersion curve of n slowed an anomalous dispersion in the visible region characterized by a peak at λ = 0.840 µm. The dielectric constants were calculated and presented. The Drude model parameters ω_{p} and ω_{τ} and d.c. conductivity were determined and compared. The results showed that such parameters could be obtained from free-electron analysis for the near IR experimental results and the intraband transition contributes significantly to the dielectric functions.

Keywords

EN

78.30.Er; 78.66.Bz

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1994
• Volume: 86
• Issue: 3
• Pages: 375-383

Dates

published

1994-05

received

1993-11-03

Contributors

author

N. El-Kadry

• Physics Department, Minia University, El-Minia, Egypt