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1994 | 86 | 3 | 375-383
Article title

Free-Electron Analysis of Optical Properties of Thermally Evaporated Gold Films

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EN
Abstracts
EN
Gold films of thicknesses 150-300 Å were deposited on quartz substrata using vacuum evaporation technique. Spectrophotometric measurements of transmission T and reflection R at normal incidence were performed in the range 0.4-3.0 µm. The real and imaginary parts of the complex refractive index ñ were determined using a developer algorithm bashed on Murmann's exact equations. The accuracy in the determined n and k was found to be ±6.0% and ±1.6%, respectively. The dispersion curve of n slowed an anomalous dispersion in the visible region characterized by a peak at λ = 0.840 µm. The dielectric constants were calculated and presented. The Drude model parameters ω_{p} and ω_{τ} and d.c. conductivity were determined and compared. The results showed that such parameters could be obtained from free-electron analysis for the near IR experimental results and the intraband transition contributes significantly to the dielectric functions.
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EN
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Year
Volume
86
Issue
3
Pages
375-383
Physical description
Dates
published
1994-05
received
1993-11-03
Contributors
author
  • Physics Department, Minia University, El-Minia, Egypt
References
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Publication order reference
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YADDA identifier
bwmeta1.element.bwnjournal-article-appv86z312kz
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