Resistivity and Temperature Coefficient of Resistivity of the Fe/Zr Multilayer Films

• Authors: T. Luciński , F. Stobiecki
• Languages of publication: EN

Abstracts

EN

The resistivity (ρ) and temperature coefficient of resistivity (TCR) dependencies on modulation wavelength (λ) were examined in Fe/Zr multi-layer thin films. It was shown that the ρ(λ) and TCR(λ) behaviours can be explained on the basis of the assumption that the amorphous phase can be spontaneously formed during the deposition process. We found that the effective thickness of the amorphous phase was ≈2 nm per single interface.

Keywords

EN

75.50.-y

Discipline

• 75.50.-y: Studies of specific magnetic materials

• Journal: Acta Physica Polonica A
• Year: 1994
• Volume: 85
• Issue: 2
• Pages: 443-447

Dates

published

1994-02

Contributors

author

T. Luciński

• Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17/19, 60-179 Poznań, Poland

author

F. Stobiecki

• Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17/19, 60-179 Poznań, Poland

Identifiers

DOI

10.12693/APhysPolA.85.443