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1994 | 85 | 2 | 443-447
Article title

Resistivity and Temperature Coefficient of Resistivity of the Fe/Zr Multilayer Films

Content
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Languages of publication
EN
Abstracts
EN
The resistivity (ρ) and temperature coefficient of resistivity (TCR) dependencies on modulation wavelength (λ) were examined in Fe/Zr multi-layer thin films. It was shown that the ρ(λ) and TCR(λ) behaviours can be explained on the basis of the assumption that the amorphous phase can be spontaneously formed during the deposition process. We found that the effective thickness of the amorphous phase was ≈2 nm per single interface.
Keywords
EN
Year
Volume
85
Issue
2
Pages
443-447
Physical description
Dates
published
1994-02
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv85z242kz
Identifiers
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