Fluorescence Processes and Scintillation of CeF_{3} Crystal Excited by UV and X-Ray Synchrotron Radiation

• Authors: C. Pédrini , A. Belsky , B. Moine , D. Bouttet
• Languages of publication: EN

Abstracts

EN

Photoluminescence properties of CeF_{3} have been investigated. Two kinds of emitting centers have been identified: regular Ce^{3+} sites exhibiting two close emission bands (285 and 300 nm) and a fast fluorescence (20 ns) and several physically different perturbed Ce^{3+} sites giving rise to a broad emission band near 340 nm and a longer fluorescence (30-40 ns) the decay time of which varies with wavelength. An energy transfer occurs between these two kinds of centers. Scintillation properties have been studied under UV and X-ray excitation. The additional fast decay always observed at short time under ionizing radiation is interpreted by a temperature dependent luminescence quenching phenomenon due to high excitation density.

Keywords

EN

71.35.+z; 78.55.Hx; 78.70.En

Discipline

• 78.70.En: X-ray emission spectra and fluorescence
• 78.55.Hx: Other solid inorganic materials

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1993
• Volume: 84
• Issue: 5
• Pages: 953-957

Dates

published

1993-11

Contributors

author

C. Pédrini

• Laboratoire de Physico-Chimie des Matériaux Luminescents, Université Claude Bernard Lyon I, URA 442 CNRS, 43, Boulevard du 11 Novembre 1918, Bgt. 205, 69622 Villeurbanne cedex, France

author

A. Belsky

• Synchrotron Radiation Laboratory, Moscow State University, 117234 Moskva, Russia

author

B. Moine

• Laboratoire de Physico-Chimie des Matériaux Luminescents, Université Claude Bernard Lyon I, URA 442 CNRS, 43, Boulevard du 11 Novembre 1918, Bgt. 205, 69622 Villeurbanne cedex, France

author

D. Bouttet

• Laboratoire de Physico-Chimie des Matériaux Luminescents, Université Claude Bernard Lyon I, URA 442 CNRS, 43, Boulevard du 11 Novembre 1918, Bgt. 205, 69622 Villeurbanne cedex, France

Identifiers

DOI

10.12693/APhysPolA.84.953