On the Symmetry of the Sulfur Pair-Related Defect in Silicon

• Authors: M. Bennebroek , A. Zakrzewski , A. Frens , J. Schmidt
• Languages of publication: EN

Abstracts

EN

A sulfur-related-pair defect in silicon has been studied with optically detected magnetic resonance spectroscopy. Measurement of the angular dependence of the optically detected magnetic resonance signals supplemented by the analysis of the spectrum "quality" yield to the conclusion that the point group symmetry of the defect studied is C_{1h}.

Keywords

EN

76.30.Lh; 71.55.Ht

Discipline

• 71.55.Ht: Other nonmetals
• 76.30.Lh: Other ions and impurities

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1993
• Volume: 84
• Issue: 4
• Pages: 725-728

Dates

published

1993-10

Contributors

author

M. Bennebroek

• Huygens Laboratorium, P.O. Box 9504, 2300 Leiden, The Netherlands

author

A. Zakrzewski

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

A. Frens

• Huygens Laboratorium, P.O. Box 9504, 2300 Leiden, The Netherlands

author

J. Schmidt

• Huygens Laboratorium, P.O. Box 9504, 2300 Leiden, The Netherlands

Identifiers

DOI

10.12693/APhysPolA.84.725