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1993 | 84 | 4 | 725-728
Article title

On the Symmetry of the Sulfur Pair-Related Defect in Silicon

Content
Title variants
Languages of publication
EN
Abstracts
EN
A sulfur-related-pair defect in silicon has been studied with optically detected magnetic resonance spectroscopy. Measurement of the angular dependence of the optically detected magnetic resonance signals supplemented by the analysis of the spectrum "quality" yield to the conclusion that the point group symmetry of the defect studied is C_{1h}.
Keywords
EN
Publisher

Year
Volume
84
Issue
4
Pages
725-728
Physical description
Dates
published
1993-10
Contributors
author
  • Huygens Laboratorium, P.O. Box 9504, 2300 Leiden, The Netherlands
author
  • Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland
author
  • Huygens Laboratorium, P.O. Box 9504, 2300 Leiden, The Netherlands
author
  • Huygens Laboratorium, P.O. Box 9504, 2300 Leiden, The Netherlands
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv84z428kz
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