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1993 | 84 | 3 | 423-433
Article title

Structural and Optical Studies of CdTe/ZnTe Superlattices with Ultrathin ZnTe Layers

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Languages of publication
EN
Abstracts
EN
Spatially selective introduction of ultrathin ZnTe layers (1 to 3 mono-layers) into CdTe allows the study of special superlattice structure, corresponding to a monomolecular plane-host crystal system. Particular attention is given to the strain state control of the inserted ZnTe monolayer. High resolution electron microscopy is used to measure the local lattice distortion: the method yields the location and the total amount of Zn per period, and the results are compared with X-ray diffraction data. Optical properties of these superlattices are also presented. All results show the ability to control ultrathin pseudomorphic layers of ZnTc within CdTe, with limited Zn segregation, and of high crystalline and optical quality. In addition, they can be fitted within the framework of elasticity theory for the structural data, and of a finite quantum well model for the optical ones, even in the ultimate limit of only one nominal ZnTe monolayer.
Keywords
EN
Publisher

Year
Volume
84
Issue
3
Pages
423-433
Physical description
Dates
published
1993-09
Contributors
author
  • CEA/CNRS Group "Microstructures de Semiconducteurs II-VI", Laboratoire de Spectrométrie Physique, Université J. Fourier, Grenoble and Département de Recherche Fondamentale sur la Matière Condensée, CENG, 85 X, 38041 Grenoble Cédex, France
author
  • CEA/CNRS Group "Microstructures de Semiconducteurs II-VI", Laboratoire de Spectrométrie Physique, Université J. Fourier, Grenoble and Département de Recherche Fondamentale sur la Matière Condensée, CENG, 85 X, 38041 Grenoble Cédex, France
author
  • CEA/CNRS Group "Microstructures de Semiconducteurs II-VI", Laboratoire de Spectrométrie Physique, Université J. Fourier, Grenoble and Département de Recherche Fondamentale sur la Matière Condensée, CENG, 85 X, 38041 Grenoble Cédex, France
author
  • CEA/CNRS Group "Microstructures de Semiconducteurs II-VI", Laboratoire de Spectrométrie Physique, Université J. Fourier, Grenoble and Département de Recherche Fondamentale sur la Matière Condensée, CENG, 85 X, 38041 Grenoble Cédex, France
author
  • CEA/CNRS Group "Microstructures de Semiconducteurs II-VI", Laboratoire de Spectrométrie Physique, Université J. Fourier, Grenoble and Département de Recherche Fondamentale sur la Matière Condensée, CENG, 85 X, 38041 Grenoble Cédex, France
author
  • CEA/CNRS Group "Microstructures de Semiconducteurs II-VI", Laboratoire de Spectrométrie Physique, Université J. Fourier, Grenoble and Département de Recherche Fondamentale sur la Matière Condensée, CENG, 85 X, 38041 Grenoble Cédex, France
References
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Publication order reference
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YADDA identifier
bwmeta1.element.bwnjournal-article-appv84z304kz
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