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1993 | 84 | 3 | 419-421
Article title

Recent Developments in Scanning Tunneling Microscopy

Authors
Content
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Languages of publication
EN
Abstracts
EN
Scanning tunneling microscopy and related local probe methods have led to a novel perception of nanometer- and atomic-scale structures and processes. Since the structural information is obtained directly in real space, the scanning probe techniques offer considerable advantages compared with diffraction techniques for the investigation of non-periodic structures at solid surfaces. In addition, the local probe methods allow to study almost any kind of physical property of microstructures with submicron down to atomic resolution.
Keywords
EN
Publisher

Year
Volume
84
Issue
3
Pages
419-421
Physical description
Dates
published
1993-09
Contributors
  • Institute of Applied Physics and Centre for Microstructural Research, University of Hamburg, Jungiusstrasse 11, 2000 Hamburg 36, Germany
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv84z303kz
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