Description and Interpretation of Systematic Deviations from Epitaxial Laws of Overgrowth

• Authors: H. Berger , P. Möck , B. Rosner
• Languages of publication: EN

Abstracts

EN

The effect of epitaxial misorientation on substrates having vicinal surfaces is studied using two simple geometrical models. The misorientations in two epitaxial systems, single layers and superlattices, can be partially explained by means of these models. Furthermore, the fundamentals of a new description tool for orientation relationships of epitaxial systems are outlined briefly, and two examples of application are given.

Keywords

EN

68.55.-a; 68.65.+g

Discipline

• 68.55.-a: Thin film structure and morphology(for methods of thin film deposition, film growth and epitaxy, see 81.15.-z)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1993
• Volume: 84
• Issue: 2
• Pages: 279-286

Dates

published

1993-08

(unknown)

1990-05-05

received

1993-02-10

Contributors

author

H. Berger

• Humboldt-Universität zu Berlin, Institut für Kristallographie und Materialforschung, Invalidenstrasse 110, Unter den Linden 6, 10099 Berlin, Germany

author

P. Möck

• Humboldt-Universität zu Berlin, Institut für Kristallographie und Materialforschung, Invalidenstrasse 110, Unter den Linden 6, 10099 Berlin, Germany

author

B. Rosner

• Humboldt-Universität zu Berlin, Institut für Kristallographie und Materialforschung, Invalidenstrasse 110, Unter den Linden 6, 10099 Berlin, Germany

Identifiers

DOI

10.12693/APhysPolA.84.279