X-Ray and Electron-Optical Characterization of ZnSe(Co) Crystal with Natural Face

• Authors: J. Auleytner , J. Domagała , Z. Gołacki , M. Pawłowska , J. Pełka , K. Regiński
• Languages of publication: EN

Abstracts

EN

Using complementary X-ray and electron-optical methods, a ZnSe(Co) crystal with natural face was investigated. X-ray diffraction methods such as double-crystal X-ray reflection topography, double-crystal diffractometry for rocking curve measurements, precise lattice constant measurements by the Bond technique were used for crystal structure characterization and X-ray fluorescence method for studies of chemical composition along the crystal. The scanning electron microscopic image of the crystal surface and reflection diffraction of the high-energy electrons enriched the crystal structure characterization. It was shown that X-ray characterization and reflection high-energy electron diffraction can be regarded as very important complementary tools for non-destructive investigation of the ZnSe(Co) crystal surface layers.

Keywords

EN

61.10.-i; 61.14.Hg; 61.16.Bg

• Journal: Acta Physica Polonica A
• Year: 1993
• Volume: 83
• Issue: 6
• Pages: 759-768

Dates

published

1993-06

received

1992-12-11

(unknown)

1993-04-14

Contributors

author

J. Auleytner

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

J. Domagała

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

Z. Gołacki

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

M. Pawłowska

• Institute of Electronic Materials Technology, CEMI, Wólczyńska 133, 01-919 Warszawa, Poland

author

J. Pełka

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

K. Regiński

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

Identifiers

DOI

10.12693/APhysPolA.83.759