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1992 | 82 | 2 | 283-294
Article title

X-Ray Microscopy and Spectromicroscopy

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EN
Abstracts
EN
Progress in the instrumentation and, in particular, in the photon sources makes it possible to implement a number of established X-ray spectroscopies in a high-lateral-resolution mode. We discuss the general trends of this field, and then we present a detailed analysis of a particular and very interesting branch: photoemission spectromicroscopy. The results include a recent world record in lateral and energy resolution, obtained by the MAXIMUM system at Wisconsin, and microimages of materials science systems as well as of neuron networks.
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EN
Contributors
  • Institut de Physique Appliquée, Ecole Polytechnique Fédérale, PH-Ecublens, 1015 Lausanne, Switzerland
References
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Publication order reference
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YADDA identifier
bwmeta1.element.bwnjournal-article-appv82z209kz
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