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1992 | 82 | 2 | 283-294
Article title

X-Ray Microscopy and Spectromicroscopy

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Content
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Languages of publication
EN
Abstracts
EN
Progress in the instrumentation and, in particular, in the photon sources makes it possible to implement a number of established X-ray spectroscopies in a high-lateral-resolution mode. We discuss the general trends of this field, and then we present a detailed analysis of a particular and very interesting branch: photoemission spectromicroscopy. The results include a recent world record in lateral and energy resolution, obtained by the MAXIMUM system at Wisconsin, and microimages of materials science systems as well as of neuron networks.
Keywords
EN
Year
Volume
82
Issue
2
Pages
283-294
Physical description
Dates
published
1992-08
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv82z209kz
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