Synchrotron Radiation Induced X-Ray Emission - SRIXE

• Authors: W. Kwiatek
• Languages of publication: EN

Abstracts

EN

The synchrotron radiation induced X-ray emission (SRIXE) technique was found very useful and sensitive for determination of trace elements content and distribution in different types of materials. Due to properties of synchrotron radiation the SRIXE technique became very unique and powerful for trace elements analysis. This paper describes the phenomena related to production of characteristic X-rays and principles of the method. The properties of SRIXE such as minimum detectable limit, spatial resolution, radiation damage, and depth sensitivity are also discussed. Selected applications are given to emphasize the usefulness of the technique.

Keywords

EN

78.70.En; 87.15.Mi

Discipline

• 78.70.En: X-ray emission spectra and fluorescence

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1992
• Volume: 82
• Issue: 2
• Pages: 263-271

Dates

published

1992-08

Contributors

author

W. Kwiatek

• Institute of Nuclear Physics, Department of Nuclear Spectroscopy, Radzikowskiego 152, 31-342 Kraków, Poland

Identifiers

DOI

10.12693/APhysPolA.82.263