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1992 | 82 | 2 | 263-271
Article title

Synchrotron Radiation Induced X-Ray Emission - SRIXE

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Languages of publication
EN
Abstracts
EN
The synchrotron radiation induced X-ray emission (SRIXE) technique was found very useful and sensitive for determination of trace elements content and distribution in different types of materials. Due to properties of synchrotron radiation the SRIXE technique became very unique and powerful for trace elements analysis. This paper describes the phenomena related to production of characteristic X-rays and principles of the method. The properties of SRIXE such as minimum detectable limit, spatial resolution, radiation damage, and depth sensitivity are also discussed. Selected applications are given to emphasize the usefulness of the technique.
Keywords
EN
Year
Volume
82
Issue
2
Pages
263-271
Physical description
Dates
published
1992-08
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv82z207kz
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