X-Ray Optics for Synchrotron Radiation

• Authors: C. Malgrange
• Languages of publication: EN

Abstracts

EN

This paper presents the main optical devices used to prepare a beam from X-ray synchrotron source: monochromators, flat or curved in order to intercept a larger angular divergence at the sample, mirrors and, finally, optics for polarized X-ray experiments. Since X-ray optics is based either on total reflection or on diffraction by perfect crystals, the basic fundamental results of X-ray dynamical theory, which are necessary to understand the reasons why one device should be chosen rather than the other, are also presented.

Keywords

EN

61.10.Dp; 78.90.+t

Discipline

• 78.90.+t: Other topics in optical properties, condensed matter spectroscopy and other interactions of particles and radiation with condensed matter (restricted to new topics in section 78)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 1992
• Volume: 82
• Issue: 1
• Pages: 13-32

Dates

published

1992-07

Contributors

author

C. Malgrange

• Laboratoire de Minéralogie-Cristallographie, associé au CNRS, Universités Paris 6 and 7, 4 pl. Jussieu, 75252 Paris Cedex 05, France

Identifiers

DOI

10.12693/APhysPolA.82.13