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1992 | 81 | 2 | 273-283
Article title

Oxidation of Polycrystalline Chromium between 30°C and 400°C

Content
Title variants
Languages of publication
EN
Abstracts
EN
The formation of coalesced oxide films on atomically clean polycrystalline chromium has been studied with Auger electron spectroscopy and secondary ion mass spectrometry at temperatures between 30°C and 400°C. The data are consistent with an initialed chemisorption of oxygen on the clean Cr followed by nucleation of chromium oxide after 2 L of exposure followed by lateral growth to form a thin, coalesced, saturated oxide film about 0.8 nm thick at 30°C. The saturated oxide was thicker at higher temperatures, being about 80 nm thick at 400°C. Detection of a CrO^{+} secondary ion was associated with chemisorbed oxygen, while O¯ ion originated from chromium oxides based upon correlation with chemical changes in the low-energy Auger spectra. Keating of the coalesced oxide caused considerable changes in both the low-energy Auger spectrum as well as the secondary ion emission. Both these as well as time-dependent, reversible changes in secondary ion emission were interpreted as structural rearrangements of the chromium oxide resulting in relative changes of oxygen either adsorbed on the surface or incorporated into chromium oxide.
Keywords
EN
Publisher

Year
Volume
81
Issue
2
Pages
273-283
Physical description
Dates
published
1992-02
received
1991-07-19
(unknown)
1991-10-30
Contributors
author
  • Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA
author
  • Department of Materials Science and Engineering, University of Florida, Gainesville, FL 32611, USA
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv81z212kz
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