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1992 | 81 | 2 | 233-238
Article title

Very Thin Silver Layer Growth on the Cu(1II) Face at Different Temperatures

Authors
Content
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Languages of publication
EN
Abstracts
EN
Measurements of work function changes (ΔΦ) and Auger Electron Spectroscopy were used for investigation of very thin silver layer adsorption on the (111) face of copper crystal. At room temperature the layer-by-layer growth was observed while at temperatures above 850 K ΔΦ and the Auger peak height kinetics indicated the presence of silver diffusion to the surface layer of the copper sample.
Keywords
EN
Publisher

Year
Volume
81
Issue
2
Pages
233-238
Physical description
Dates
published
1992-02
received
1991-05-22
(unknown)
1991-07-17
Contributors
author
  • Institute of Experimental Physics, University of Wrocław, Cybulskiego 36, 50-205 Wrocław
author
  • Institute of Experimental Physics, University of Wrocław, Cybulskiego 36, 50-205 Wrocław
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv81z207kz
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