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1991 | 80 | 5 | 665-673
Article title

Thin Films Investigations by Means of Spin-Wave Resonance

Content
Title variants
Languages of publication
EN
Abstracts
EN
Magnetic resonance technique may successfully be applied to determine some basic parameters such as g-factor, magnetization M_{s} or anisotropy energy constant K_{u} in thin magnetic films. These parameters are obtained from a ferromagnetic resonance experiment when uniform precession of M_{s} takes place. From spin-wave resonance one may extract very valuable information on the exchange constant A or the surface conditions characterized by the surface anisotropy energy (or pinning parameters ρ). In fact, it is only spin-wave resonance or similar techniques which allow for measurements of A, ρ or the coupling constant K_{c} between ferromagnetic sublayers in multi-layered structure. The magnetic phase diagram, temperature dependence of the spin-waves stiffness constant, and the anisotropy energy constant may also be listed as less common examples of spin-wave resonance technique application for the investigation of thin films. This paper presents a theoretical approach to typical examples of experimental results and their interpretation from spin-wave resonance measurements.
Keywords
EN
Year
Volume
80
Issue
5
Pages
665-673
Physical description
Dates
published
1991-11
received
1991-03-21
References
Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv80z504kz
Identifiers
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