Point-Contact I-V Characteristics of the Electroluminescent ZnS:Mn,Cu Thin Films Studied by STM

• Authors: S. Szuba , R. Czajka , W. Gordon , W. Polewska , J. Raułuszkiewicz , A. Reich
• Languages of publication: EN

Abstracts

EN

STM images of ZnS:Mn,Cu thin films and spatially resolved current-voltage characteristics are shown. The results make possible to estimate the morphology and conductivity distribution with nanometer resolution.

Keywords

EN

72.80.Ey; 73.40.Gk; 73.60.Fw

Discipline

• 72.80.Ey: III-V and II-VI semiconductors
• 73.40.Gk: Tunneling(for tunneling in quantum Hall effects, see 73.43.Jn)

• Journal: Acta Physica Polonica A
• Year: 1991
• Volume: 79
• Issue: 2-3
• Pages: 171-174

Dates

published

1991-02

received

1990-08-08

Contributors

author

S. Szuba

• Institute of Physics, Poznań Technical University, Piotrowo 3, 60-965 Poznań, Poland

author

R. Czajka

• Institute of Physics, Poznań Technical University, Piotrowo 3, 60-965 Poznań, Poland

author

W. Gordon

• Institute of Physics, Poznań Technical University, Piotrowo 3, 60-965 Poznań, Poland

author

W. Polewska

• Institute of Physics, Poznań Technical University, Piotrowo 3, 60-965 Poznań, Poland

author

J. Raułuszkiewicz

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

author

A. Reich

• Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warszawa, Poland

Identifiers

DOI

10.12693/APhysPolA.79.171