Electron Emission from Extended Defects in DLTS Experiment
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Dislocations parallel to a Schottky junction are considered as an example of well defined extended defects, and their behaviour in DLTS experiment is examined. A possibility of electron hopping between different traps of the defect, and inter-electronic Coulomb interaction are taken into account. Thermal electron emission from the considered defects is no longer exponential with time and consequences of this fact are discussed.
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