Fractal Features and Structural, Morphological, Optical Characteristics of Sol-Gel Derived Silica Nanoparticled Thin Films

• Authors: B. Uysal , Ö. Pekcan
• Languages of publication: EN

Abstracts

EN

Nanostructured silica films using a simple and effective sol-gel spin coating technique were synthesized and the influence of ammonia/sol ratios on the particle size and thickness of this film was investigated. In addition, fractal dimensions of the prepared films were determined using the scattering response technique. The samples were characterized by atomic force microscopy and UV-vis spectroscopy. Comparing optical method and image analysis of atomic force microscopy micrographs, the fractal dimension of silica nanoparticled thin films was determined. The fractal dimensions of the films verified by atomic force microscopy analysis were found to be around 2.03 which is very close to the values (2.0358, 2.0325, and 2.0335) obtained using optical method. As a result of these findings, precise determination of the nanoparticled silica thin films fractal dimension using both optical and surface analysis methods was realized.

Keywords

EN

fractal dimension; silica; sol-gel method; size-dependence; thin films

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2018
• Volume: 133
• Issue: 5
• Pages: 1160-1164

Dates

published

2018-05

received

2017-01-26

(unknown)

2018-03-23

Contributors

author

B. Uysal

• Kadir Has University, Faculty of Engineering and Natural Sciences, Cibali, Fatih, Istanbul 34083, Turkey

author

Ö. Pekcan

• Kadir Has University, Faculty of Engineering and Natural Sciences, Cibali, Fatih, Istanbul 34083, Turkey

Identifiers

DOI

10.12693/APhysPolA.133.1160