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2018 | 133 | 5 | 1124-1128
Article title

Examination of the Change of the Characteristic X-Rays of the Zinc in Fluorine- and Boron-Doped ZnO Thin Films

Content
Title variants
Languages of publication
EN
Abstracts
EN
In this study, K_{β}/K_{α} X-ray intensity ratios of zinc in pure zinc, undoped ZnO thin film and boron and fluorine-doped ZnO thin films have been investigated. These samples have been excited by 59.5 keV γ-rays from a ^{241}Am annular radioactive source. K X-rays emitted by the samples have been counted using an Ultra-LEGe detector with a resolution of 150 eV at 5.9 keV. The K_{β}/K_{α} X-ray intensity ratios of the doped ZnO thin films have been compared with that of the undoped ZnO thin film. The deviations between the results can be explained by delocalization and/or charge transfer phenomena causing change in valence electronic configuration of zinc.
Keywords
Publisher

Year
Volume
133
Issue
5
Pages
1124-1128
Physical description
Dates
published
2018-05
received
2016-08-31
(unknown)
2017-07-28
(unknown)
2018-03-05
Contributors
author
  • Kahramanmaraş Sutcu Imam University, Faculty of Science and Letters, Department of Physics, 46100 Kahramanmaraş, Turkey
author
  • Kahramanmaras Sutcu Imam University, Elbistan Technology Faculty Energy Systems Engineering, 46300 Kahramanmaraş, Turkey
author
  • Karadeniz Technical University, Faculty of Science, Department of Physics, 61080 Trabzon, Turkey
  • Alanya Alaaddin Keykubat Üniversitesi, Faculty of Engineering, Department of Fundamental Sciences, 07450 Antalya, Turkey
author
  • Karadeniz Technical University, Faculty of Science, Department of Physics, 61080 Trabzon, Turkey
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv133n5p2
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