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Abstracts
The structure of the surface and spectra of the cathodoluminescence of Y₂O₃:Eu thin films when changing the activator concentration in the range 1.0-7.5% by mole obtained by RF sputtering were investigated. On the base of the shape of the cathodoluminescence spectra at different concentrations of the activator, the possibility of irregular solutions creating of yttrium and europium oxides and the structural features of the small and large crystallites forming the film Y₂O₃:Eu is shown. The dependence of the cathodoluminescence intensity on the energy of the exited electrons and current density of electron irradiation was established.
Discipline
- 81.15.-z: Methods of deposition of films and coatings; film growth and epitaxy(for structure of thin films, see 68.55.-a; see also 85.40.Sz Deposition technology in microelectronics; for epitaxial dielectric films, see 77.55.Px)
- 78.60.Hk: Cathodoluminescence, ionoluminescence
- 68.37.Ps: Atomic force microscopy (AFM)
Journal
Year
Volume
Issue
Pages
914-917
Physical description
Dates
published
2018-04
Contributors
author
- Ivan Franko Lviv National University, Dragomanova Str. 50, 79005, Lviv, Ukraine
author
- Ivan Franko Lviv National University, Dragomanova Str. 50, 79005, Lviv, Ukraine
author
- Ivan Franko Lviv National University, Dragomanova Str. 50, 79005, Lviv, Ukraine
author
- Ivan Franko Lviv National University, Dragomanova Str. 50, 79005, Lviv, Ukraine
References
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv133n4p36kz