Control of Radiation Sensitivity of the Oxygen-Containing Fluorite Crystals

• Authors: S. Kachan , V. Salapak , O. Nahurskiy , I. Pirko
• Languages of publication: EN

Abstracts

EN

The parameters of radiation sensitivity of the oxygen-doped fluorite crystals were calculated in a one-dimensional model. The limit concentrations of the color centers as a function of the concentration of the oxygen impurity in the fluorite crystal were defined. Fluorite crystals with anti-Frenkel defects in the anion sublattice of the crystal have a specific property: the discolored after irradiation crystal being irradiated repeatedly with ionizing radiation retains the "memory" of the preceding irradiation. Using an ion chain model this paper studies under what conditions the "radiation memory" effect can arise in the MeF₂-O²¯ crystals as well as the extent of its contribution into the overall radiation sensitivity of the crystal.

Keywords

EN

61.80.-x; 78.47.-p; 78.70.-g

Discipline

• 61.80.-x: Physical radiation effects, radiation damage(for photochemical reactions, see 82.50.-m; for effects of ionizing radiation on biological systems, see 87.53.-j)
• 78.70.-g: Interactions of particles and radiation with matter
• 78.47.-p: Spectroscopy of solid state dynamics

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2018
• Volume: 133
• Issue: 4
• Pages: 824-828

Dates

published

2018-04

Contributors

author

S. Kachan

• Lviv Polytechnic National University, 12 Bandera Str., 79013 Lviv, 79013, Ukraine

author

V. Salapak

• Ukrainian National Forestry University, 103 Gen. Chuprynky Str., Lviv, 79057, Ukraine

author

O. Nahurskiy

• Lviv Polytechnic National University, 12 Bandera Str., 79013 Lviv, 79013, Ukraine

author

I. Pirko

• Ukrainian National Forestry University, 103 Gen. Chuprynky Str., Lviv, 79057, Ukraine

References

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• [3] E.M. Olimpios, Radiat. Eff. 14, 119 (1972) , doi: 10.1080/00337577208230481
• [4] P.W.M. Jacobs, S.H. Ong, A.V. Chadwick, V.M. Carr, J. Solid State Chem. 33, 159 (1980) , doi: 10.1016/0022-4596(80)90115-2
• [5] W. Bollman, Phys. Status Solidi A 60, 661 (1980) , doi: 10.1002/pssa.201600246
• [6] S.I. Kachan, E.E. Obukhova, V.F. Shtanko, E.P. Chinkov, Acta Phys. Pol. A 117, 195 (2010) , doi: 10.12693/APhysPolA.117.195

Identifiers

DOI

10.12693/APhysPolA.131.824