Exchange Coupling Effects in Naturally Oxidised Ultrathin Iron Film

• Authors: H. Dawczak-Dębicki , A. Marczyńska , A. Rogowska , M. Wachowiak , M. Nowicki , S. Pacanowski , B. Jabłoński , R. Czajka , L. Smardz
• Languages of publication: EN

Abstracts

EN

Oxidation process of Fe films under atmospheric conditions is depth limited such that an oxide covering layer with a well-defined thickness is formed by which the underlying metal is prevented from further oxidation. Iron thin film with an initial thickness d_{i}=4 nm was deposited onto 1.6 nm - V(110) buffer layer using UHV magnetron sputtering. The planar growth of Fe oxides was revealed by atomic force microscopy. X-ray photoelectron spectroscopy studies performed after 250 days of oxidation revealed formation of a hematite (α-Fe₂O₃) ultrathin film on the metallic rest of iron. Furthermore, low temperature magnetic measurements of the oxidised Fe ultrathin film revealed an exchange anisotropy which is imposed to the metallic rest. As a result, we have observed at low temperatures a shift and broadening of the hysteresis loops due to the exchange interaction at the metal-oxide interface.

Keywords

EN

75.70.-i; 75.70.Kw

Discipline

• 75.70.-i: Magnetic properties of thin films, surfaces, and interfaces(for magnetic properties of nanostructures, see 75.75.-c)
• 75.70.Kw: Domain structure (including magnetic bubbles and vortices)(for domain structure in ferroelectricity and antiferroelectricity, see 77.80.Dj)

• Journal: Acta Physica Polonica A
• Year: 2018
• Volume: 133
• Issue: 3
• Pages: 601-604

Dates

published

2018-03

Contributors

author

H. Dawczak-Dębicki

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
• Faculty of Physics, Adam Mickiewicz University, Umultowska 85, 61-614 Poznań, Poland

author

A. Marczyńska

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

A. Rogowska

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
• Faculty of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland

author

M. Wachowiak

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
• Faculty of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland

author

M. Nowicki

• Faculty of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland

author

S. Pacanowski

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

author

B. Jabłoński

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland
• Faculty of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland

author

R. Czajka

• Faculty of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland

author

L. Smardz

• Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznań, Poland

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Identifiers

DOI

10.12693/APhysPolA.133.601