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2017 | 132 | 5 | 1585-1589

Article title

Defect Range and Evolution in Swift Xe-Ion Irradiated Pure Silver Studied by Positron Annihilation Technique

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EN

Abstracts

EN
Variable energy positron beam and positron lifetime spectroscopy were used to study pure silver samples exposed to irradiation with swift Xe²⁶⁺ ions of energy 167 MeV with different dose: of 10¹³, 5×10¹³ and 10¹⁴ ions/cm². The positron lifetime spectroscopy revealed the presence of dislocations or vacancies associated with dislocations. They are distributed at the depth of about 6 μm, and this correlates with the ion implantation range, i.e. 9 μm. However, some defects are observed also to a depth of about 18 μm. At the depth less than 1 μm from the entrance surface strong dependence of positron diffusion length on the dose is observed. It indicates the presence of interstitial atoms and/or dislocation loops as a result of Xe²⁶⁺ ions implantation.

Keywords

EN

Contributors

author
  • Institute of Nuclear Physics, Polish Academy of Sciences, PL-31342 Kraków, Poland
author
  • Institute of Nuclear Physics, Polish Academy of Sciences, PL-31342 Kraków, Poland
  • Joint Institute for Nuclear Research, Joliot-Curie 6, 141980 Dubna, Moscow region, Russia
author
  • Joint Institute for Nuclear Research, Joliot-Curie 6, 141980 Dubna, Moscow region, Russia
  • National Research Nuclear University MEPhI, Kashirskoye sh. 31, 115409 Moscow, Russia
  • Dubna State University, Universitetskaya 19, 141980 Dubna, Moscow region, Russia

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Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv132n5p33kz
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