Preferences help
enabled [disable] Abstract
Number of results
2017 | 132 | 4 | 1430-1435
Article title

Raman Characterisation of Cd_{1-x}Zn_x Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

Title variants
Languages of publication
In this work, we studied the Raman spectra of thick polycrystalline Cd_{1-x}Zn_x Te (CZT) films with x ranged from 0.06 to 0.68. Additionally, the surface morphology and structural properties were studied in order to determine the crystalline quality of the samples. The Raman spectra had a two-mode behavior typical for CZT solid solution and showed CdTe- and ZnTe-like longitudinal and transverse optical modes. The relationship between the frequencies of CdTe- and ZnTe-related modes on x was studied. We observed the deviation of the compositional dependence of phonon mode frequencies for polycrystalline CZT films in comparison with a similar dependence for CZT single crystals. Such deviation was caused by the effect of structural defects in polycrystalline films on frequencies of vibrational modes. The values of excitation wavelength, which allow achieving of high signal-to-noise ratio on the Raman spectra of CZT films with different zinc concentration in the result of resonant enhancement of phonon modes intensities, were experimentally determined.
Physical description
  • Sumy State University, 2, Rymsky Korsakov Str., 40007 Sumy, Ukraine
  • Sumy State University, 2, Rymsky Korsakov Str., 40007 Sumy, Ukraine
  • Sumy State University, 2, Rymsky Korsakov Str., 40007 Sumy, Ukraine
  • Sumy State University, 2, Rymsky Korsakov Str., 40007 Sumy, Ukraine
  • Chernivtsi National University, 2, Kotsiubynskogo Str., Chernivtsi, Ukraine
  • Riga Technical University, 3 Paula Valdena Str., LV-1048, Riga, Latvia
  • [1] R. Triboulet, P. Siffert, CdTe and Related Compounds; Physics, Defects, Hetero- and Nanostructures, Crystal Growth, Surfaces and Applications, Elsevier, Amsterdam 2010
  • [2] M. Fiederle, T. Feltgen, J. Meinhardt, M. Rogalla, K.W. Benz, J. Cryst. Growth 197, 635 (1999), doi: 10.1016/S0022-0248(98)00761-1
  • [3] S. del Sordo, L. Abbene, E. Caroli, A.M. Mancini, A. Zappettini, P. Ubertini, Sensors 9, 3491 (2009), doi: 10.3390/s90503491
  • [4] P. Mahawela, G. Sivaraman, S. Jeedigunta, J. Gaduputi, M. Ramalingam, S. Subramanian, S. Vakkalanka, C. Ferekides, D.L. Morel, Mater. Sci. Eng. B Solid-State Mater. Adv. Technol. 116, 283 (2005), doi: 10.1016/j.mseb.2004.05.054
  • [5] P.J. Sellin, Nucl. Instrum. Methods Phys. Res. A 563, 1 (2006), doi: 10.1016/j.nima.2006.01.110
  • [6] H. Zhou, D. Zeng, S. Pan, Nucl. Instrum. Methods Phys. Res. A 698, 81 (2013), doi: 10.1016/j.nima.2012.09.024
  • [7] R. Dhere, T. Gessert, J. Zhou, S. Asher, J. Pankow, H. Moutinho, Mater. Res. Soc. Symp. Proc. 763, 409 (2003)
  • [8] R.G. Solanki, Indian J. Pure Appl. Phys. 48, 133 (2010)
  • [9] N. Amin, A. Yamada, M. Konagai, Jpn. J. Appl. Phys. Part 1 41, 2834 (2002), doi: 10.1143/JJAP.41.2834
  • [10] K. Prabakar, S. Venkatachalam, Y.L. Jeyachandran, S.K. Narayandass, D. Mangalaraj, Mater. Sci. Eng. B 107, 99 (2004), doi: 10.1016/j.mseb.2003.10.017
  • [11] J. Tao, H. Xu, Y. Zhang, H. Ji, R. Xu, J. Huang, J. Zhang, X. Liang, K. Tang, L. Wang, Appl. Surf. Sci. 388, 180 (2016), doi: 10.1016/j.apsusc.2016.01.245
  • [12] V. Kosyak, Y. Znamenshchykov, A. Čerškus, Y.P. Gnatenko, L. Grase, J. Vecstaudza, A. Medvids, A. Opanasyuk, G. Mezinskis, J. Alloys Comp. 682, 543 (2016), doi: 10.1016/j.jallcom.2016.05.065
  • [13] D. Kurbatov, A. Opanasyuk, H. Khlyap, Phys. Status Solidi A 206, 1549 (2009), doi: 10.1002/pssa.200824472
  • [14] C.J. Panchal, A.S. Opanasyuk, V.V. Kosyak, M.S. Desai, I.Y. Protsenko, J. Nano- Electron. Phys. 3, 274 (2011)
  • [15] S. Perkowitz, L.S. Kim, Z.C. Feng, Phys. Rev. B 42, 1455 (1990), doi: 10.1103/PhysRevB.42.1455
  • [16] D.N. Talwar, Z.C. Feng, P. Becla, Phys. Rev. B 48, 17064 (1993), doi: 10.1103/PhysRevB.48.17064
  • [17] D.J. Olego, P.M. Raccah, J.P. Faurie, Phys. Rev. B 33, 3819 (1986), doi: 10.1103/PhysRevB.33.3819
  • [18] M. Jain, II-VI Semiconductor Compounds, World Sci., 1993, doi: 10.1142/1747
  • [19] F. Cerdeira, C.J. Buchenauer, F.H. Pollak, M. Cardona, Phys. Rev. B 5, 580 (1972), doi: 10.1103/PhysRevB.5.580
  • [20] D. Nam, H. Cheong, A.S. Opanasyuk, P.V. Koval, V.V. Kosyak, P.M. Fochuk, Phys. Status Solidi C 4, 1 (2014), doi: 10.1002/pssc.201300577
  • [21] A.S. Opanasyuk, D.I. Kurbatov, V.V. Kosyak, S.I. Kshniakina, S.N. Danilchenko, Crystallogr. Rep. 57, 927 (2012), doi: 10.1134/S1063774512070206
  • [22] JCPDS, International Centre for Diffraction Data, USA, Card Number 15-0770
  • [23] B.E. Warren, X-ray Diffraction, Dover, New York 1990
  • [24] Y.V. Znamenshchykov, V.V. Kosyak, A.S. Opanasyuk, E. Dauksta, A.A. Ponomarov, A.V. Romanenko, A.S. Stanislavov, A. Medvids, I.O. Shpetnyi, Yu.I. Gorobets, Mater. Sci. Semicond. Process. 63, 64 (2017), doi: 10.1016/j.mssp.2017.02.004
  • [25] S. Stolyarova, F. Edelman, A. Chack, A. Berner, P. Werner, N. Zakharov, M. Vytrykhivsky, R. Beserman, R. Weil, Y. Nemirovsky, J. Phys. D Appl. Phys. 41, 65402 (2008), doi: 10.1088/0022-3727/41/6/065402
  • [26] Y.V. Znamenshchykov, V.V. Kosyak, A.S. Opanasyuk, M.M. Kolesnyk, P.M. Fochuk, Funct. Mater. 23, 1 (2016), doi: 10.15407/fm23.01.1
  • [27] D. Kurbatov, V. Kosyak, M. Kolesnyk, A. Opanasyuk, S. Danilchenko, Integr. Ferroelectr. 103, 32 (2008), doi: 10.1080/10584580802558126
  • [28] A.R. Bushroa, R.G. Rahbari, H.H. Masjuki, M.R. Muhamad, Vacuum 86, 1107 (2012), doi: 10.1016/j.vacuum.2011.10.011
  • [29] V. Kosyak, Y. Znamenshchykov, A. Čerškus, L. Grase, Y.P. Gnatenko, A. Medvids, A. Opanasyuk, G. Mezinskis, J. Lumin. 171, 176 (2016), doi: 10.1016/j.jlumin.2015.11.027
  • [30] J.L. Reno, E.D. Jones, Phys. Rev. B 45, 1440 (1992), doi: 10.1103/PhysRevB.45.1440
  • [31] A. Aydinli, A. Compaan, G. Contreras-Puente, A. Mason, Solid State Commun. 80, 465 (1991), doi: 10.1016/0038-1098(91)90051-V
  • [32] K.R. Murali, Sol. Energy 82, 220 (2008), doi: 10.1016/j.solener.2007.07.007
  • [33] Y.L. Wu, Y.-T. Chen, Z.C. Feng, J.-F. Lee, P. Becla, W. Lu, Hard X-Ray, Gamma-Ray, Neutron Detect. Phys. XI 7449, 74490Q (2009), doi: 10.1117/12.825823
  • [34] S.A. Hawkins, E. Villa-Aleman, M.C. Duff, D.B. Hunter, A. Burger, M. Groza, V. Buliga, D.R. Blacket, J. Electron. Mater. 37, 1438 (2008), doi: 10.1007/s11664-008-0448-x
  • [35] J.F. Scott, R.C. Leite, T.C. Damen, Phys. Rev. 188, 1285 (1969), doi: 10.1103/PhysRev.188.1285
Document Type
Publication order reference
YADDA identifier
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.