Comparison of Five-Layered ZrO₂ and Single-Layered Ce, Eu, and Dy-Doped ZrO₂ Thin Films Prepared by Sol-Gel Spin Coating Method

• Authors: N. Çiçek Bezir , A. Evcin , R. Kayali , M. Özen , K. Esen
• Languages of publication: EN

Abstracts

EN

In order to investigate the influence of the number of layers on the properties of ZrO₂ thin films, we prepared one pure ZrO₂ film sample with five layers and Ce, Eu, and Dy-doped ZrO₂ samples with single layer, by spin-coating sol gel-method. The crystal structures of thin films were determined using X-ray diffraction, morphology of the samples was analyzed by scanning electron microscopy, and the optical properties of the samples were determined by ultraviolet/visible absorbance measurements. The results of these measurements have shown that the concentration of the dopants and the thickness of thin film layers play a vital role in the physical, chemical, and optical properties of the pure and doped ZrO₂ thin films.

Keywords

EN

68.37.-d; 68.55-a; 68.60-p; 78.20.-e; 81.10.Dn; 71.20.Be

Discipline

• 68.37.-d: Microscopy of surfaces, interfaces, and thin films
• 78.20.-e: Optical properties of bulk materials and thin films(for optical properties related to materials treatment, see 81.40.Tv; for optical materials, see 42.70-a; for optical properties of superconductors, see 74.25.Gz; for optical properties of rocks and minerals, see 91.60.Mk; for optical properties of specific thin films, see 78.66.-w)
• 81.10.Dn: Growth from solutions
• 71.20.Be: Transition metals and alloys

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 132
• Issue: 3
• Pages: 612-616

Dates

published

2017-09

Contributors

author

N. Çiçek Bezir

• Department of Physics, Faculty of Art and Science, Süleyman Demirel University, 32260 Isparta, Turkey

author

A. Evcin

• Department of Materials Science and Engineering, Faculty of Engineering, Afyon Kocatepe University, 03200 Afyonkarahisar, Turkey

author

R. Kayali

• Department of Physics, Faculty of Art and Science, Ömer Halisdemir University, 51200 Nigde, Turkey

author

M. Özen

• Department of Physics, Faculty of Art and Science, Ömer Halisdemir University, 51200 Nigde, Turkey

author

K. Esen

• Department of Physics, Faculty of Art and Science, Süleyman Demirel University, 32260 Isparta, Turkey

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Identifiers

DOI

10.12693/APhysPolA.132.612