Microhardness and the Young Modulus of Thin, MBE-Grown, (Sn,Mn)Te Layers Containing up to 8% of Mn

• Authors: S. Adamiak , M. Zięba , R. Minikayev , A. Reszka , B. Taliashvili , W. Szuszkiewicz
• Languages of publication: EN

Abstracts

EN

The thin layers of (Sn,Mn)Te solid solution were grown by molecular beam epitaxy onto (111)-oriented BaF₂ substrates and characterized by scanning electron microscopy, atomic force microscopy, energy dispersive X-ray spectrometry, and X-ray diffraction methods. The epitaxial character of the growth was confirmed. All the layers exhibited a regular (fcc) structure of the rock-salt type and were (111)-oriented, their thickness was close to about 1 μm. The layers contained up to 8% of Mn. The microhardness and the Young modulus values were determined by the nanoindentation measurements. The Berkovich type of the intender was applied, the maximum applied load was equal to 1 mN. The results of measurements demonstrated a lack of the composition dependence of the Young modulus value. A slight increase of the microhardness value with an increasing Mn content in the (Sn,Mn)Te solid solution was observed.

Keywords

EN

62.20.de; 62.20.Qp; 68.60.Bs

Discipline

• 62.20.de: Elastic moduli
• 62.20.Qp: Friction, tribology, and hardness(see also 46.55.+d Tribology and mechanical contacts in continuum mechanics of solids; for materials treatment effects on friction related properties, see 81.40.Pq)
• 68.60.Bs: Mechanical and acoustical properties

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 132
• Issue: 2
• Pages: 347-350

Dates

published

2017-08

Contributors

author

S. Adamiak

• Faculty of Mathematics and Natural Sciences, University of Rzeszów, S. Pigonia 1, PL-35310 Rzeszów, Poland

author

M. Zięba

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

R. Minikayev

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

A. Reszka

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

B. Taliashvili

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

W. Szuszkiewicz

• Faculty of Mathematics and Natural Sciences, University of Rzeszów, S. Pigonia 1, PL-35310 Rzeszów, Poland
• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

References

• [1] E.S. Božin, C.D. Malliakas, P. Souvatzis, T. Proffen, N.A. Spaldin, M.G. Kanatzidis, S.J.L. Billinge, Science 330, 1660 (2010), doi: 10.1126/science.1192759
• [2] O. Delaire, J. Ma, K. Marty, F. May, M. McGuire, M.-H. Du, D.J. Singh, A. Podlesnyak, G. Ehlers, M.D. Lumsden, B.C. Sales, Nat. Mater. 10, 614 (2011), doi: 10.1038/NMAT3035
• [3] Y. Tanaka, Z. Ren, T. Sato, K. Nakayama, S. Souma, T. Takahashi, K. Segawa, Nat. Phys. 8, 800 (2012), doi: 10.1038/NPHYS.2442
• [4] P. Dziawa, B.J. Kowalski, K. Dybko, R. Buczko, A. Szczerbakow, M. Szot, E. Łusakowska, T. Balasubremanian, B.M. Wojek, M.H. Berntsen, O. Tjernberg, T. Story, Nat. Mater. 11, 1023 (2012), doi: 10.1038/NMAT3449
• [5] M. Sist, E.M. Jensen Hedegaard, S. Christensen, N. Bindzus, K.F. Fearch Fischer, H. Kasai, K. Sugimoto, B. Brummerstedt Iversen, Int. Union. Cryst. J. 3, 377 (2016), doi: 10.1107/S2052252516012707
• [6] P.J.T. Eggenkamp, C.W.H.M. Vennix, T. Story, H.J.M. Swagten, C.H.W. Swüste, W.J.M.J. de Jonge, J. Appl. Phys. 75, 5728 (1994), doi: 10.1063/1.355596
• [7] J. He, X. Tan, J. Xu, G.-Q. H. Liu, H. Shao, Y. Fu, X. Wang, Z. Liu, J. Xu, H. Jiang, J. Jiang, J. Mater. Chem. A 3, 19974 (2015), doi: 10.1039/c5ta05535k
• [8] W. Li, Z. Chen, S. Lin, Y. Chang, B. Ge, Y. Chen, Y. Pei, J. Materiom. 1, 307 (2015), doi: 10.1016/j.jmat.2015.09.001
• [9] G. Tan, F. Shi, S. Hao, H. Chi, T.P. Bailey, L.-D. Zhao, C. Uher, C. Wolverton, V.P. Dravid, M.G. Kanatzidis, J. Am. Chem. Soc. 127, 11507 (2015), doi: 10.1021/jacs.5b07284
• [10] S.M. Li, J.Q. Li, L. Yang, F.S. Liu, W.Q. Ao, Y. Li, Mater. Des. 108, 51 (2016), doi: 10.1016/j.matdes.2016.06.084
• [11] S. Acharya, J. Pandey, A. Soni, Appl. Phys. Lett. 109, 133904 (2016), doi: 10.1063/1.4963728
• [12] R. Diduszko, V. Domuchowski, A.J. Nadolny, J. Sadowski, Thin Solid Films 367, 168 (2000), doi: 10.1016/S0040-6090(00)00682-9
• [13] W. Szuszkiewicz, E. Dynowska, B. Witkowska, B. Hennion, Phys. Rev. B 73, 104403 (2006), doi: 10.1103/PhysRevB.73.104403
• [14] E. Janik, E. Dynowska, J. Bak, M. Leszczynski, W. Szuszkiewicz, T. Wojtowicz, G. Karczewski, A.K. Zakrzewski, J. Kossut, Thin Solid Films 267, 74 (1995), doi: 10.1016/0040-6090(95)06632-2
• [15] J.L. Cui, X. Qian, X.B. Zhao, J. Alloys Comp. 358, 228 (2003), doi: 10.1016/S0925-8388(03)00049-5
• [16] A.J. Crocker, M. Wilson, J. Mater. Sci. 13, 833 (1978), doi: 10.1007/BF00570520
• [17] R. Kuna, R. Minikayev, M. Trzyna, K. Gas, A. Bosak, A. Szczerbakow, S. Petit, J. Łażewski, W. Szuszkiewicz, Acta. Phys. Pol. A 130, 1251 (2016), doi: 10.12693/APhysPolA.130.1251
• [18] B. Li, P. Xie, S. Zhang, D. Liu, J. Mater. Sci. 46, 4000 (2011), doi: 10.1007/s10853-011-5327-9
• [19] A. Schmitz, J. de Boor, K. Mull, E. Müller, J. Mater. Sci. 51, 6933 (2016)
• [20] R.D. Schmidt, E.D. Case, L.-D. Zhao, M.G. Kanatzidis, J. Mater. Sci. 50, 1770 (2015), doi: 10.1007/s10853-014-8740-z

Identifiers

DOI

10.12693/APhysPolA.132.347