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2017 | 132 | 2 | 316-318
Article title

Relative Reflection Difference as a Method for Measuring the Thickness of the Exfoliated MoSe₂ Layers

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EN
Abstracts
EN
We propose a method for measuring the thickness of the exfoliated MoSe₂ layers deposited on Si/SiO₂ substrate, based on the reflectance measurements performed with laser light illumination at two different wavelengths: red and green from confocal microscope at room temperature. We demonstrate the correlation between the number of layers in a flake and the value of its relative reflection difference. We applied the transfer matrix method to calculate the reflectivity and verify our experimental results. The approach proposed by us allows for fast and automatic verification of the exfoliated MoSe₂ layers thickness on large areas of the substrate.
Keywords
Year
Volume
132
Issue
2
Pages
316-318
Physical description
Dates
published
2017-08
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv132n2p26kz
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