Effect of Sample Thickness on Carbon Ejection from Ultrathin Graphite Bombarded by keV C_{60}

• Authors: M. Golunski , Z. Postawa
• Languages of publication: EN

Abstracts

EN

Molecular dynamics computer simulations are employed to investigate the effect of a sample thickness on the ejection process from ultrathin graphite. The thickness of graphite varies from 2 to 16 graphene layers and the system is bombarded by 10 keV C₆₀ projectiles at normal incidence. The ejection yield and the kinetic energy of emitted atoms are monitored. The implications of the results to a novel analytical approach in secondary ion mass spectrometry based on the ultrathin free-standing graphene substrates and transmission geometry are discussed.

Keywords

EN

Computer simulations; sputtering; graphene

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 132
• Issue: 2
• Pages: 222-224

Dates

published

2017-08

Contributors

author

M. Golunski

• Institute of Physics, Jagiellonian University, S. Łojasiewicza 11, 30-348 Kraków, Poland

author

Z. Postawa

• Institute of Physics, Jagiellonian University, S. Łojasiewicza 11, 30-348 Kraków, Poland

References

• [1] B.J. Garrison, Z. Postawa, Mass Spectrom. Rev. 27, 289 (2008), doi: 10.1002/mas.20165
• [2] N. Winograd, Anal. Chem. 77, 142A (2005), doi: 10.1021/ac053355f
• [3] D. Weibel, S. Wong, N. Lockyer, P. Blenkinsopp, R. Hill, J.C. Vickerman, Anal. Chem. 75, 1754 (2003), doi: 10.1021/ac026338o
• [4] S.V. Verkhoturov, S. Geng, B. Czerwinski, A.E. Young, A. Delcorte, E.A. Schweikert, J. Chem. Phys. 143, 164302 (2015), doi: 10.1063/1.4933310
• [5] K.D. Krantzman, R.P. Webb, B.J. Garrison, Appl. Surf. Sci. 255, 837 (2008), doi: 10.1016/j.apsusc.2008.05.236
• [6] J.T. Tian, T. Zheng, J.Y. Yang, S.Y. Kong, J.M. Xue, Y.G. Wang, K. Nordlund, Appl. Surf. Sci. 337, 6 (2015), doi: 10.1016/j.apsusc.2015.01.241
• [7] M. Kerford, R.P. Webb, Nucl. Instrum. Methods Phys. Res. B 153, 270 (1999), doi: 10.1016/S0168-583X(99)00200-1
• [8] M. Kerford, R.P. Webb, Nucl. Instrum. Methods Phys. Res. B 180, 44 (2001), doi: 10.1016/S0168-583X(01)00395-0
• [9] R.P. Webb, Radiat. Eff. Def. Solids 162, 567 (2007), doi: 10.1080/10420150701564936
• [10] R.P. Webb, M. Kerford, M. Kappes, G. Brauchle, Radiat. Eff. Def. Solids 142, 23 (1997), doi: 10.1080/10420159708211593
• [11] C. Anders, H. Kirihata, Y. Yamaguchi, H.M. Urbassek, Nucl. Instrum. Methods Phys. Res. B 255, 247 (2007), doi: 10.1016/j.nimb.2006.11.027
• [12] B.J. Garrison, A. Delcorte, K.D. Krantzman, Acc. Chem. Res. 33, 69 (2000), doi: 10.1021/ar970135i
• [13] R. Chatterjee, Z. Postawa, N. Winograd, B.J. Garrison, J. Phys. Chem. B 103, 151 (1999), doi: 10.1021/jp9833045
• [14] Z. Postawa, Appl. Surf. Sci. 231, 22 (2004), doi: 10.1016/j.apsusc.2004.03.019
• [15] B. Czerwinski, R. Samson, B.J. Garrison, N. Winograd, Z. Postawa, Vacuum 81, 167 (2006), doi: 10.1016/j.vacuum.2006.03.012
• [16] L.C. Liu, Y. Liu, S.V. Zybin, H. Sun, W.A. Goddard, J. Phys. Chem. A 115, 11016 (2011), doi: 10.1021/jp201599t
• [17] Z. Postawa, B. Czerwinski, M. Szewczyk, E.J. Smiley, N. Winograd, B.J. Garrison, Anal. Chem. 75, 4402 (2003), doi: 10.1021/ac034387a

Identifiers

DOI

10.12693/APhysPolA.132.222