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Abstracts
This article gives an overview of the use of X-ray absorption spectroscopy to characterize the magnetic properties for technologically important, low dimensional magnetic materials. An overview is given both for the experimental hardware, the measurements and the analysis of the spectra. The information obtained is discussed for metallic and semiconducting systems, using both the X-ray magnetic circular dichroism and the X-ray linear magnetic dichroism spectroscopy.
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Journal
Year
Volume
Issue
Pages
408
Physical description
Dates
published
2017-08
Contributors
author
- Institute of Physics, Polish Academy of Sciences, al. Lotnikw 32/46, 02-668 Warsaw, Poland
References
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv132n2_erratumkz