EMR Spectra Thin Films Doped with High Concentration of Co and Cr on Quartz and Sapphire Substrates

• Authors: B. Cieniek , I. Stefaniuk , I. Virt
• Languages of publication: EN

Abstracts

EN

We have studied magnetic properties of zinc-oxide composite doped with high concentration (up to 20%) of Co and Cr ions. The pulsed laser deposition method was used to obtain samples on quartz glass and sapphire substrates. Samples were annealed at 100-250°C for ZnO on quartz substrate, and 300-700°C on sapphire substrate. EMR measurements were carried out and temperature dependence of the EMR spectra was obtained. The angular dependence in two samples orientation, vertical and horizontal, were also obtained. Analysis of the temperature dependences of the integral intensity of EMR spectra was carried out using the Curie-Weiss law.

Keywords

EN

68.35.bg; 75.30.Gw; 76.30.-v

Discipline

• 68.35.bg: Semiconductors
• 75.30.Gw: Magnetic anisotropy
• 76.30.-v: Electron paramagnetic resonance and relaxation(see also 33.35.+r Electron resonance and relaxation in atomic and molecular physics; 87.80.Lg Magnetic and paramagnetic resonance in biological physics)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 132
• Issue: 1
• Pages: 30-34

Dates

published

2017-07

Contributors

author

B. Cieniek

• Faculty of Mathematics and Natural Sciences, University of Rzeszów, S. Pigonia 1, 35-959 Rzeszów, Poland

author

I. Stefaniuk

• Faculty of Mathematics and Natural Sciences, University of Rzeszów, S. Pigonia 1, 35-959 Rzeszów, Poland

author

I. Virt

• Faculty of Mathematics and Natural Sciences, University of Rzeszów, S. Pigonia 1, 35-959 Rzeszów, Poland

References

• [1] T. Dietl, J. Phys. Condens. Matter 19, 165204 (2007), doi: 10.1088/0953-8984/19/16/165204
• [2] J. Weng, Y. Zhang, G. Han, Y. Zhang, L. Xu, J. Xu, X. Huang, K. Chen, Thin Solid Films 478, 25 (2005), doi: 10.1016/j.tsf.2004.09.047
• [3] J. Wilkinson, K.B. Ucer, R.T. Wiliams, Radiat. Meas. 38, 501 (2004), doi: 10.1016/j.radmeas.2004.01.022
• [4] K.X. Ya, H. Yin, T.M. De, T.M. Jing, Mater. Res. Bull. 33, 1703 (1998), doi: 10.1016/S0025-5408(98)00160-3
• [5] J. Xu, Q. Pan, Y. Shun, Z. Tian, Sensor. Actuat. B Chem. 66, 277 (2000), doi: 10.1016/S0925-4005(00)00381-6
• [6] N. Samarth, J.K. Furdyna, Phys. Rev. B 37, 9227 (1988), doi: 10.1103/PhysRevB.37.9227
• [7] N. Volbers, H. Zhou, C. Knies, D. Pfisterer, J. Sann, D.M. Hofmann, B.K. Meyer, Appl. Phys. A Mater. 88, 153 (2007), doi: 10.1007/s00339-007-3960-6
• [8] Semiconductors Spintronics and Quantum Computation, Eds. D.D. Awschalom, D. Loss, N. Samarth, Springer, New York 2002, doi: 10.1007/978-3-662-05003-3
• [9] J.K. Furdyna, J. Appl. Phys. 64, R29 (1988), doi: 10.1063/1.341700
• [10] H. Ohno, Science 281, 951 (1998), doi: 10.1126/science.281.5379.951
• [11] W. Dobrowolski, J. Kossut, T. Story, in: Handbook of Magnetic Materials Vol. 15, Ed. K.H.J. Bushow, Elsevier, Netherlands 2003, p. 289, doi: 10.1016/S1567-2719(03)15003-2
• [12] K. Sato, H. Katayama-Yoshida, Jpn. J. Appl. Phys. 39, L555 (2000), doi: 10.1143/JJAP.39.L555
• [13] K. Sato, H. Katayama-Yoshida, Jpn. J. Appl. Phys. 40, L334 (2001), doi: 10.1143/JJAP.40.L334
• [14] W. Prellier, A. Fouchet, B. Mercey, Ch. Simon, B. Raveau, Appl. Phys. Lett. 82, 3490 (2003), doi: 10.1063/1.1578183
• [15] K. Ueda, H. Tabata, T. Kawai, Appl. Phys. Lett. 79, 988 (2001), doi: 10.1063/1.1384478
• [16] T. Dietl, H. Ohno, F. Matsukura, J. Cibert, D. Ferrand, Science 287, 1019 (2000), doi: 10.1126/science.287.5455.1019
• [17] Q. Xu, H. Schmidt, S. Zhou, K. Potzger, M. Helm, H. Hochmuth, M. Lorenz, A. Setzer, P. Esquinazi, C. Meinecke, M. Grundmann, Appl. Phys. Lett. 92, 082508 (2008), doi: 10.1063/1.2885730
• [18] S.W. Jung, S.-J. An, G.-C. Yi, C.U. Jung, S.-I. Lee, S. Cho, Appl. Phys. Lett. 80, 4561 (2002), doi: 10.1063/1.1487927
• [19] D.A. Schwartz, N.S. Norberg, Q.P. Nguyen, J.M. Parker, D.R. Gamelin, J. Am. Chem. Soc. 125, 13205 (2003), doi: 10.1021/ja036811v
• [20] H.-J. Lee, S.-Y. Jeong, C.R. Cho, C.H. Park, Appl. Phys. Lett. 81, 4020 (2002), doi: 10.1063/1.1517405
• [21] Y.M. Cho, W.K Choo, H. Kim, D. Kim, Y.E. Ihm, Appl. Phys. Lett. 80, 3358 (2002), doi: 10.1063/1.1478146
• [22] P. Sharma, A. Gupta, K.V. Rao, F.J. Owens, R. Sharma, R. Ahuja, J.M. Osorio Guillen, B. Johansson, G.A. Gehring, Nat. Mater. 2, 673 (2003), doi: 10.1038/nmat984
• [23] T. Wakano, N. Fujimura, Y. Morinaga, N. Abe, A. Ashida, T. Ito, Physica E 10, 260 (2001), doi: 10.1016/S1386-9477(01)00095-9
• [24] J.H. Kim, H. Kim, D. Kim, Y.E. Ihm, W.K. Choo, J. Appl. Phys. 92, 6066 (2002), doi: 10.1063/1.1513890
• [25] A.O. Ankiewicz, M.C. Carmo, N.A. Sobolev, W. Gehlhoff, E.M. Kaidashev, A. Rahm, M. Lorenz, M. Grundmann, J. Appl. Phys. 101, 024324 (2007), doi: 10.1063/1.2402095
• [26] A.F. Jalbout, H. Chen, S.L. Whittenburg, Appl. Phys. Lett. 81, 2217 (2002), doi: 10.1063/1.1508168
• [27] E.-C. Lee, K.J. Chang, Phys. Rev. B 69, 085205 (2004), doi: 10.1103/PhysRevB.69.085205
• [28] B. Cieniek, I. Stefaniuk, I. Virt, Nukleonika 58, 359 (2013)
• [29] J.S. Dyck, Č. Drašar, P. Lošt'ák, C. Uher, Phys. Rev. B 71, 115214 (2005), doi: 10.1103/PhysRevB.71.115214
• [30] D.L. Huber, G. Alejandro, A. Caneiro, M.T. Causa, F. Prado, M. Tovar, S.B. Oseroff, Phys. Rev. B 60, 12155 (1999), doi: 10.1103/PhysRevB.60.12155

Identifiers

DOI

10.12693/APhysPolA.132.30