PL EN


Preferences help
enabled [disable] Abstract
Number of results
2017 | 132 | 1 | 30-34
Article title

EMR Spectra Thin Films Doped with High Concentration of Co and Cr on Quartz and Sapphire Substrates

Content
Title variants
Languages of publication
EN
Abstracts
EN
We have studied magnetic properties of zinc-oxide composite doped with high concentration (up to 20%) of Co and Cr ions. The pulsed laser deposition method was used to obtain samples on quartz glass and sapphire substrates. Samples were annealed at 100-250°C for ZnO on quartz substrate, and 300-700°C on sapphire substrate. EMR measurements were carried out and temperature dependence of the EMR spectra was obtained. The angular dependence in two samples orientation, vertical and horizontal, were also obtained. Analysis of the temperature dependences of the integral intensity of EMR spectra was carried out using the Curie-Weiss law.
Keywords
EN
Contributors
author
  • Faculty of Mathematics and Natural Sciences, University of Rzeszów, S. Pigonia 1, 35-959 Rzeszów, Poland
author
  • Faculty of Mathematics and Natural Sciences, University of Rzeszów, S. Pigonia 1, 35-959 Rzeszów, Poland
author
  • Faculty of Mathematics and Natural Sciences, University of Rzeszów, S. Pigonia 1, 35-959 Rzeszów, Poland
References
  • [1] T. Dietl, J. Phys. Condens. Matter 19, 165204 (2007), doi: 10.1088/0953-8984/19/16/165204
  • [2] J. Weng, Y. Zhang, G. Han, Y. Zhang, L. Xu, J. Xu, X. Huang, K. Chen, Thin Solid Films 478, 25 (2005), doi: 10.1016/j.tsf.2004.09.047
  • [3] J. Wilkinson, K.B. Ucer, R.T. Wiliams, Radiat. Meas. 38, 501 (2004), doi: 10.1016/j.radmeas.2004.01.022
  • [4] K.X. Ya, H. Yin, T.M. De, T.M. Jing, Mater. Res. Bull. 33, 1703 (1998), doi: 10.1016/S0025-5408(98)00160-3
  • [5] J. Xu, Q. Pan, Y. Shun, Z. Tian, Sensor. Actuat. B Chem. 66, 277 (2000), doi: 10.1016/S0925-4005(00)00381-6
  • [6] N. Samarth, J.K. Furdyna, Phys. Rev. B 37, 9227 (1988), doi: 10.1103/PhysRevB.37.9227
  • [7] N. Volbers, H. Zhou, C. Knies, D. Pfisterer, J. Sann, D.M. Hofmann, B.K. Meyer, Appl. Phys. A Mater. 88, 153 (2007), doi: 10.1007/s00339-007-3960-6
  • [8] Semiconductors Spintronics and Quantum Computation, Eds. D.D. Awschalom, D. Loss, N. Samarth, Springer, New York 2002, doi: 10.1007/978-3-662-05003-3
  • [9] J.K. Furdyna, J. Appl. Phys. 64, R29 (1988), doi: 10.1063/1.341700
  • [10] H. Ohno, Science 281, 951 (1998), doi: 10.1126/science.281.5379.951
  • [11] W. Dobrowolski, J. Kossut, T. Story, in: Handbook of Magnetic Materials Vol. 15, Ed. K.H.J. Bushow, Elsevier, Netherlands 2003, p. 289, doi: 10.1016/S1567-2719(03)15003-2
  • [12] K. Sato, H. Katayama-Yoshida, Jpn. J. Appl. Phys. 39, L555 (2000), doi: 10.1143/JJAP.39.L555
  • [13] K. Sato, H. Katayama-Yoshida, Jpn. J. Appl. Phys. 40, L334 (2001), doi: 10.1143/JJAP.40.L334
  • [14] W. Prellier, A. Fouchet, B. Mercey, Ch. Simon, B. Raveau, Appl. Phys. Lett. 82, 3490 (2003), doi: 10.1063/1.1578183
  • [15] K. Ueda, H. Tabata, T. Kawai, Appl. Phys. Lett. 79, 988 (2001), doi: 10.1063/1.1384478
  • [16] T. Dietl, H. Ohno, F. Matsukura, J. Cibert, D. Ferrand, Science 287, 1019 (2000), doi: 10.1126/science.287.5455.1019
  • [17] Q. Xu, H. Schmidt, S. Zhou, K. Potzger, M. Helm, H. Hochmuth, M. Lorenz, A. Setzer, P. Esquinazi, C. Meinecke, M. Grundmann, Appl. Phys. Lett. 92, 082508 (2008), doi: 10.1063/1.2885730
  • [18] S.W. Jung, S.-J. An, G.-C. Yi, C.U. Jung, S.-I. Lee, S. Cho, Appl. Phys. Lett. 80, 4561 (2002), doi: 10.1063/1.1487927
  • [19] D.A. Schwartz, N.S. Norberg, Q.P. Nguyen, J.M. Parker, D.R. Gamelin, J. Am. Chem. Soc. 125, 13205 (2003), doi: 10.1021/ja036811v
  • [20] H.-J. Lee, S.-Y. Jeong, C.R. Cho, C.H. Park, Appl. Phys. Lett. 81, 4020 (2002), doi: 10.1063/1.1517405
  • [21] Y.M. Cho, W.K Choo, H. Kim, D. Kim, Y.E. Ihm, Appl. Phys. Lett. 80, 3358 (2002), doi: 10.1063/1.1478146
  • [22] P. Sharma, A. Gupta, K.V. Rao, F.J. Owens, R. Sharma, R. Ahuja, J.M. Osorio Guillen, B. Johansson, G.A. Gehring, Nat. Mater. 2, 673 (2003), doi: 10.1038/nmat984
  • [23] T. Wakano, N. Fujimura, Y. Morinaga, N. Abe, A. Ashida, T. Ito, Physica E 10, 260 (2001), doi: 10.1016/S1386-9477(01)00095-9
  • [24] J.H. Kim, H. Kim, D. Kim, Y.E. Ihm, W.K. Choo, J. Appl. Phys. 92, 6066 (2002), doi: 10.1063/1.1513890
  • [25] A.O. Ankiewicz, M.C. Carmo, N.A. Sobolev, W. Gehlhoff, E.M. Kaidashev, A. Rahm, M. Lorenz, M. Grundmann, J. Appl. Phys. 101, 024324 (2007), doi: 10.1063/1.2402095
  • [26] A.F. Jalbout, H. Chen, S.L. Whittenburg, Appl. Phys. Lett. 81, 2217 (2002), doi: 10.1063/1.1508168
  • [27] E.-C. Lee, K.J. Chang, Phys. Rev. B 69, 085205 (2004), doi: 10.1103/PhysRevB.69.085205
  • [28] B. Cieniek, I. Stefaniuk, I. Virt, Nukleonika 58, 359 (2013)
  • [29] J.S. Dyck, Č. Drašar, P. Lošt'ák, C. Uher, Phys. Rev. B 71, 115214 (2005), doi: 10.1103/PhysRevB.71.115214
  • [30] D.L. Huber, G. Alejandro, A. Caneiro, M.T. Causa, F. Prado, M. Tovar, S.B. Oseroff, Phys. Rev. B 60, 12155 (1999), doi: 10.1103/PhysRevB.60.12155
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv132n1p06kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.