Application of Graphics Processing Unit for In-Line Electron Holography

• Authors: K. Morawiec , P. Dłużewski , S. Kret , A. Szczepańska , T. Li , J. Sloan
• Languages of publication: EN

Abstracts

EN

In the present work, software for exit electron wave reconstruction based on the iterative approach was implemented and a new method for drift-correction of the focal series was proposed.

Keywords

EN

68.37.Lp; 68.37.Og; 68.55.Nq; 42.30.Rx; 61.05.jp; 07.05.Pj; 42.30.-d; 42.30.Wb

Discipline

• 68.37.Og: High-resolution transmission electron microscopy (HRTEM)
• 42.30.Wb: Image reconstruction; tomography
• 42.30.Rx: Phase retrieval
• 42.30.-d: Imaging and optical processing
• 68.37.Lp: Transmission electron microscopy (TEM)
• 68.55.Nq: Composition and phase identification
• 61.05.jp: Electron holography
• 07.05.Pj: Image processing(see also 42.30.Va in optics; 87.57.-s Medical imaging in biological and medical physics; 95.75.Tv Digitization techniques in astronomy)

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 131
• Issue: 5
• Pages: 1353-1356

Dates

published

2017-05

Contributors

author

K. Morawiec

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

P. Dłużewski

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

S. Kret

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

A. Szczepańska

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

T. Li

• Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

author

J. Sloan

• Department of Physics, University of Warwick, Coventry CV4 7AL, United Kingdom

References

• [1] M.A. Dyson, Ph.D. Thesis, University of Warwick, Coventry 2014 http://webcat.warwick.ac.uk/record=b2834769~S1
• [2] C.T. Koch, Micron 63, 69 (2014), doi: 10.1016/j.micron.2013.10.009
• [3] R.R. Meyer, A.I. Kirkland, W.O. Saxton, Ultramicroscopy 92, 89 (2002), doi: 10.1016/S0304-3991(02)00071-2
• [4] R.R. Meyer, A.I. Kirkland, W.O. Saxton, Ultramicroscopy 99, 115 (2004), doi: 10.1016/j.ultramic.2003.11.001
• [5] L.J. Allen, W. McBride, N.L. O'Leary, M.P. Oxley, Ultramicroscopy 100, 91 (2004), doi: 10.1016/j.ultramic.2004.01.012
• [6] K. Ishizuka, Microscopy 62 , S109 (2013), doi: 10.1093/jmicro/dft005
• [7] A.I. Kirkland, J. Sloan, S. Haigh, Ultramicroscopy 107, 501 (2007), doi: 10.1016/j.ultramic.2006.03.014
• [8] C. Ozsoy-Keskinbora, C.B. Boothroyd, R.E. Dunin-Borkowski, P.A. van Aken, C.T. Koch, Sci. Rep. 4, 7020 (2014), doi: 10.1038/srep07020

Identifiers

DOI

10.12693/APhysPolA.131.1353