NiTi Shape Memory Marformed Alloy Studied by Electron Beam Precession TEM Orientation Mapping Method

• Authors: P. Świec , M. Zubko , Z. Lekston , D. Stróż
• Languages of publication: EN

Abstracts

EN

Severe plastic deformation by cold-rolling in martensitic state was applied to Ni_{50.4}Ti_{49.6} shape memory alloy. Received materials with 17, 20, 25, and 35% deformation were further annealed at 450°C for 15 min. After such treatment hardness of this alloy increased significantly reaching 365 HV0.5 for highest deformation degree. Calorimetric studies revealed two-stage and two-step character of martensitic transformation occurring in all specimens. Nanocrystalline structure with average grain size 53, 34, 28, and 24 nm was obtained. In material with 35% of deformation amorphous regions containing a nuclei of B2 parental phase with average size of 5 nm were observed. To determine the crystallographic orientation of observed nanograins and for better phase analysis, electron beam precession transmission electron microscopy orientation mapping was performed.

Keywords

EN

62.20.fg; 62.20.F-; 61.43.Dq; 61.66.Bi; 68.37.Ef; 62.25.-g; 64.70.Nd

Discipline

• 62.20.fg: Shape-memory effect; yield stress; superelasticity
• 61.66.Bi: Elemental solids
• 62.25.-g: Mechanical properties of nanoscale systems(for structure of nanoscale systems, see 61.46.-w; for structural transitions in nanoscale materials, see 64.70.Nd; for electronic transport in nanoscale systems, see 73.63.-b)
• 61.43.Dq: Amorphous semiconductors, metals, and alloys
• 62.20.F-: Deformation and plasticity(see also 83.50.-v Deformation and flow in rheology; for materials treatment effects on deformation, see 81.40.Lm)
• 68.37.Ef: Scanning tunneling microscopy (including chemistry induced with STM)
• 64.70.Nd: Structural transitions in nanoscale materials

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 131
• Issue: 5
• Pages: 1307-1310

Dates

published

2017-05

Contributors

author

P. Świec

• Institute of Material Science, University of Silesia, 75 Pułku Piechoty 1a, 41-500 Chorzów, Poland

author

M. Zubko

• Institute of Material Science, University of Silesia, 75 Pułku Piechoty 1a, 41-500 Chorzów, Poland

author

Z. Lekston

• Institute of Material Science, University of Silesia, 75 Pułku Piechoty 1a, 41-500 Chorzów, Poland

author

D. Stróż

• Institute of Material Science, University of Silesia, 75 Pułku Piechoty 1a, 41-500 Chorzów, Poland

References

• [1] T. Duerig, D. Stoeckel, D. Johnson, Proc. SPIE 4763, 7 (2002), doi: 10.1117/12.508666
• [2] K. Otsuka, X. Ren, Progr. Mater. Sci. 50, 511 (2005), doi: 10.1016/j.pmatsci.2004.10.001
• [3] A.V. Sergueeva, C. Song, R.Z. Valiev, A.K. Mukherjee, Mater. Sci. Eng. A 339, 159 (2003), doi: 10.1016/S0921-5093(02)00122-3
• [4] S.D. Prokoshkin, V. Brailovski, K.E. Inaekyan, V. Demersb, I.Yu. Khmelevskaya, S.V. Dobatkin, E.V. Tatyanin, Mater. Sci. Eng. A 481-482, 114 (2008), doi: 10.1016/j.msea.2007.02.150
• [5] S.H. Chang, S.K. Wu, G.H. Chang, Scr. Mater. 52, 1341 (2005), doi: 10.1016/j.scriptamat.2005.02.006
• [6] D. Stróż, J. Palka, Z. Lekston, G. Dercz, Mater. Sci. Forum 738-739, 501 (2013) ., doi: 10.4028/www.scientific.net/SSP.154.59
• [7] P. Świec, M. Zubko, Z. Lekston, D. Stróż, Acta Phys. Pol. A 130, 1063 (2016), doi: 10.12693/APhysPolA.130.1063
• [8] A. Eggeman, P. Midgley, Adv. Imag. Electron Phys. 170, 1 (2012), doi: 10.1016/B978-0-12-394396-5.00001-4
• [9] R. Vincent, P. Midgley, Ultramicroscopy 53, 271 (1994), doi: 10.1016/0304-3991(94)90039-6
• [10] H. Morawiec, D. Stróż, T. Goryczka, D. Chrobak, Scr. Mater. 35, 485 (1996), doi: 10.1016/1359-6462(96)00179-0
• [11] M. Peterlechner, T. Waitz, H.P. Karnthaler, 566 Scr. Mater. 59, 566 (2008), doi: 10.1016/j.scriptamat.2008.05.004

Identifiers

DOI

10.12693/APhysPolA.131.1307