Functional Properties of Monolayer and Bilayer Graphene Hall-Effect Sensors

• Authors: M. Kachniarz , O. Petruk , J. Salach , T. Ciuk , W. Strupiński , A. Bieńkowski , R. Szewczyk
• Languages of publication: EN

Abstracts

EN

The paper describes the design, development, and investigation of a new type of Hall-effect sensors of a magnetic field made of graphene. The epitaxial growth of high-quality graphene structures was performed using a standard hot-wall CVD reactor, which allows for easy integration with an existing semiconductors production technologies. The functional properties of developed Hall-effect sensors based on graphene were investigated on special experimental setup utilizing Helmholtz coils as a source of reference magnetic field. Monolayer and quasi-free-standing bilayer graphene structures were tested. Results presented in the paper indicate that graphene is very promising material for development of Hall-effect sensors. Developed graphene Hall-effect sensor exhibit highly linear characteristics and high magnetic field sensitivity.

Keywords

EN

07.55.Ge; 85.75.Ss; 85.30.Fg; 81.05.ue; 73.22.Pr; 72.80.Vp

Discipline

• 85.75.Ss: Magnetic field sensors using spin polarized transport
• 85.30.Fg: Bulk semiconductor and conductivity oscillation devices (including Hall effect devices, space-charge-limited devices, and Gunn effect devices)
• 81.05.ue: Graphene(for structure of graphene, see 61.48.Gh; for phonons in graphene, see 63.22.Rc; for thermal properties, see 65.80.Ck; for graphene films, see 68.65.Pq; for electronic transport, see 72.80.Vp; for electronic structure, see 73.22.Pr; for optical properties, see 78.67.Wj)
• 72.80.Vp: Electronic transport in graphene
• 73.22.Pr: Electronic structure of graphene
• 07.55.Ge: Magnetometers for magnetic field measurements

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2017
• Volume: 131
• Issue: 5
• Pages: 1250-1253

Dates

published

2017-05

Contributors

author

M. Kachniarz

• Industrial Research Institute for Automation and Measurements, Al. Jerozolimskie 202, 02-486 Warsaw, Poland

author

O. Petruk

• Industrial Research Institute for Automation and Measurements, Al. Jerozolimskie 202, 02-486 Warsaw, Poland

author

J. Salach

• Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, sw. A. Boboli 8, 02-525 Warsaw, Poland

author

T. Ciuk

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

W. Strupiński

• Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

author

A. Bieńkowski

• Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, sw. A. Boboli 8, 02-525 Warsaw, Poland

author

R. Szewczyk

• Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, sw. A. Boboli 8, 02-525 Warsaw, Poland

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Identifiers

DOI

10.12693/APhysPolA.131.1250