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Number of results
2017 | 131 | 4 | 1186-1188

Article title

Implementation of Conductance Tomography in Detection of the Hall Sensors Inhomogeneity

Content

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EN

Abstracts

EN
Tomography is a useful tool for objects reconstruction in non-destructive testing. Many kinds of tomography, depending on the penetrating wave character, are available and adapted for specific application. This paper presents new kind of tomography - conductance tomography extended with a Hall effect. Its development was motivated by the need on inhomogeneity detection in thin film Hall effect sensor, particularly graphene Hall effect sensors. Paper presents complete description of the tomographic method and tomography software developed in the GNU Octave. Inverse transformation is based on optimization method. Each shape reconstruction was done with the finite element method using the open source software: Elmer FEM and Salome. Results confirmed the suitability of the work.

Keywords

Contributors

author
  • Industrial Research Institute for Automation and Measurements, Al. Jerozolimskie 202, 02-486 Warsaw, Poland
author
  • Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, sw. A. Boboli 8, 02-525 Warsaw, Poland
author
  • Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, sw. A. Boboli 8, 02-525 Warsaw, Poland

References

  • [1] J. Korvink, O. Paul, MEMS: A Practical Guide to Design, Analysis and Applications, William Andrew, New York 2005, doi: 10.1007/978-3-540-33655-6
  • [2] H. Huang, D. Wang, Y. Xu, Sensors 15, 27359 (2015), doi: 10.3390/s151027359
  • [3] A. Udo, Sensors, 2004, Proc. IEEE 3, (2004), doi: 10.1109/ICSENS.2004.1426372
  • [4] M. Kachniarz, O. Petruk, R. Szewczyk, in: Advances in Intelligent Systems and Computing, Vol. 440, Eds. R. Szewczyk, C. Zielinski, M. Kaliczyńska, Springer, Berlin 2016, p. 763, doi: 10.1007/978-3-319-29357-8
  • [5] S. Tumanski, Handbook of Magnetic Measurements, CRC Press, 2011, doi: 10.1201/b10979
  • [6] O. Petruk, R. Szewczyk, in: Advances in Intelligent Systems and Computing, Vol. 267, Eds. R. Szewczyk, C. Zielinski, M. Kaliczyńska, Springer, Berlin 2014, p. 631, doi: 10.1007/978-3-319-05353-0
  • [7] A. Cultrera, L. Callegaro, in: 2015 IEEE 1st Int. Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow (RTSI), Turin (Italy) 2015, p. 297, doi: 10.1109/RTSI.2015.7325114
  • [8] M.V.P. Kruger, K. Poolla, C.J. Spanos, in: Proc. 2002 American Control Conf. (IEEE Cat. No.CH37301), Anchorage (AK) 2002, p. 3678, doi: 10.1109/ACC.2002.1024499

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv131n4189kz
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