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Number of results
2017 | 131 | 4 | 988-990

Article title

X-Ray Diffraction Study of CeT₂Al₁₀ (T = Ru, Os) at Low Temperatures and under Pressures

Content

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Languages of publication

EN

Abstracts

EN
We have carried out a powder X-ray diffraction investigation on antiferromagnetic Kondo semiconductors CeRu₂Al₁₀ and CeOs₂Al₁₀ at low temperatures and under high pressures as well as the structural investigation on single crystal of these compounds. The results of powder X-ray studies of CeRu₂Al₁₀ and CeOs₂Al₁₀ indicate that these compounds do not have structural transition at its antiferromagnetic ordering temperature. The results of single crystal structural refinement indicate that the b-axis of this crystal structure is insensitive not only to pressure but also to temperature and that the effect of cooling to Ce-Ce distance for CeRu₂Al₁₀ is the same as that for CeOs₂Al₁₀.

Keywords

EN

Contributors

author
  • Muroran Institute of Technology, Muroran, Hokkaido 050-8585, Japan
author
  • Muroran Institute of Technology, Muroran, Hokkaido 050-8585, Japan
author
  • Muroran Institute of Technology, Muroran, Hokkaido 050-8585, Japan
author
  • Muroran Institute of Technology, Muroran, Hokkaido 050-8585, Japan
author
  • Hiroshima University, Higashi-Hiroshima, Hiroshima 739-8530, Japan
author
  • Hiroshima University, Higashi-Hiroshima, Hiroshima 739-8530, Japan
author
  • National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan
author
  • ISSP, University of Tokyo, Kashiwa, Chiba 277-8581, Japan
author
  • Nihon University, Sakurajosui, Setagaya, Tokyo 156-8550, Japan
author
  • Kochi University, Kochi, Kochi 780-8520, Japan

References

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Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv131n4123kz
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