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Number of results
2017 | 131 | 4 | 988-990
Article title

X-Ray Diffraction Study of CeT₂Al₁₀ (T = Ru, Os) at Low Temperatures and under Pressures

Content
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Languages of publication
EN
Abstracts
EN
We have carried out a powder X-ray diffraction investigation on antiferromagnetic Kondo semiconductors CeRu₂Al₁₀ and CeOs₂Al₁₀ at low temperatures and under high pressures as well as the structural investigation on single crystal of these compounds. The results of powder X-ray studies of CeRu₂Al₁₀ and CeOs₂Al₁₀ indicate that these compounds do not have structural transition at its antiferromagnetic ordering temperature. The results of single crystal structural refinement indicate that the b-axis of this crystal structure is insensitive not only to pressure but also to temperature and that the effect of cooling to Ce-Ce distance for CeRu₂Al₁₀ is the same as that for CeOs₂Al₁₀.
Keywords
EN
Year
Volume
131
Issue
4
Pages
988-990
Physical description
Dates
published
2017-04
References
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Document Type
Publication order reference
YADDA identifier
bwmeta1.element.bwnjournal-article-appv131n4123kz
Identifiers
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