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2017 | 131 | 4 | 848-850

Article title

Characterization of Epitaxial LSMO Films Grown on STO Substrates

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Abstracts

EN
Epitaxial manganite La_{0.67}Sr_{0.33}MnO₃ (LSMO) layers, with a thickness of 20-50 nm, are prepared on single crystal (001) SrTiO₃ (STO) substrates by pulsed laser deposition technique. Structural characterization (composition analysis, surface morphology), investigated by the Rutherford backscattering spectroscopy and atomic force microscopy, reveals the growth of stoichiometric LSMO films with a smooth surface (root-mean-square value of 0.21-1.6 nm). The prepared LSMO films possess high Curie temperature ( ≈ 412 K), low room temperature resistivity (1-2 mΩ cm) and maximum of temperature coefficient of resistivity TCR = 2.7% K¯¹ at 321 K.

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Contributors

author
  • Institute of Electrical Engineering SAS, Dúbravská cesta 9, 84104 Bratislava, Slovakia
author
  • Institute of Electrical Engineering SAS, Dúbravská cesta 9, 84104 Bratislava, Slovakia
author
  • Institute of Electrical Engineering SAS, Dúbravská cesta 9, 84104 Bratislava, Slovakia
author
  • Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
author
  • Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
author
  • Institute of Electrical Engineering SAS, Dúbravská cesta 9, 84104 Bratislava, Slovakia
  • Joint Institute for Nuclear Research, Dubna, Moscow Region, Russia
author
  • Joint Institute for Nuclear Research, Dubna, Moscow Region, Russia
author
  • Faculty of Mathematics, Physics and Informatics, Comenius University, Mlynská Dolina F1, 842 48 Bratislava, Slovakia
author
  • Institute of Electrical Engineering SAS, Dúbravská cesta 9, 84104 Bratislava, Slovakia

References

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bwmeta1.element.bwnjournal-article-appv131n4078kz
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