Full-text resources of PSJD and other databases are now available in the new Library of Science.
Visit https://bibliotekanauki.pl

PL EN


Preferences help
enabled [disable] Abstract
Number of results
2016 | 130 | 5 | 1199-1201

Article title

Optical Characterization of ZnO Nanorods Grown by the Ultra-Fast and Low Temperature Hydrothermal Process

Content

Title variants

Languages of publication

EN

Abstracts

EN
The results of photoluminescence investigations of zinc oxide nanorods are reported. These nanorods grown on undoped silicon substrates were obtained by low temperature and ultra-fast version of a microwave-assisted hydrothermal method. The photoluminescence investigations show very high quality of the obtained material. From photoluminescence studies we conclude the lack of carrier localization effects. The photoluminescence is dominated by band gap edge emission of bound excitonic (donor bound excitons) origin. Thus, the photoluminescence quenching observed at increased temperatures is associated with thermal ionization of shallow donors. From photoluminescence analysis (changes of photoluminescence line width) a strength of exciton-acoustic phonon coupling is evaluated.

Keywords

Contributors

author
  • Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland
  • Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland
author
  • Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland
  • Dept. of Mathematics and Natural Sciences College of Science, Cardinal S. Wyszynski University, Dewajtis 5, 01-815 Warsaw, Poland

References

  • [1] C. Klingshirn, Phys. Status Solidi B 244, 3027 (2007), doi: 10.1002/pssb.200790012
  • [2] M. Godlewski, E. Guziewicz, G. Łuka, T. Krajewski, M. Łukasiewicz, Ł. Wachnicki, A. Wachnicka, K. Kopalko, A. Sarem, B. Dalati, Thin Solid Films 518, 1145 (2009), doi: 10.1016/j.tsf.2009.04.066
  • [3] S. Gieraltowska, L. Wachnicki, B.S. Witkowski, M. Godlewski, E. Guziewicz, Thin Solid Films 520, 14 (2012), doi: 10.1016/j.tsf.2011.10.151
  • [4] R. Pietruszka, B.S. Witkowski, S. Gieraltowska, P. Caban, L. Wachnicki, E. Zielony, K. Gwozdz, P. Bieganski, E. Placzek-Popko, M. Godlewski, Solar Energy Mater. Solar Cells 143, 99 (2015), doi: 10.1016/j.solmat.2015.06.042
  • [5] B.S. Witkowski, L. Wachnicki, S. Gieraltowska, P. Sybilski, K. Kopalko, M. Stachowicz, M. Godlewski, Phys. Status Solidi C 11, 9 (2014), doi: 10.1002/pssc.201300761
  • [6] U. Ozgur, D. Hofstetter, H. Morkoc, Proc. IEEE 98, 7 (2010), doi: 10.1109/JPROC.2010.2044550
  • [7] B.S. Witkowski, L. Wachnicki, S. Gieraltowska, P. Dluzewski, A. Szczepanska, J. Kaszewski, M. Godlewski, Int. J. Nanotechnol. 11, 758 (2014), doi: 10.1504/IJNT.2014.063786
  • [8] Q. Li, S.J. Xu, M.H. Xie, S.Y. Tong, J. Phys. Condens. Matter 17, 30 (2005), doi: 10.1088/0953-8984/17/30/011
  • [9] S. Rudin, T.L. Reinecke, B. Segall, Phys. Rev. B 42, 11218 (1990), doi: 10.1103/PhysRevB.42.11218
  • [10] B.S. Witkowski, L. Wachnicki, S. Gieraltowska, A. Reszka, B.J. Kowalski, M. Godlewski, Microsc. Microanal. 21, 3 (2015), doi: 10.1017/S1431927615000264
  • [11] Y. Chen, D.M. Bagnall, H. Koh, K. Park, K. Hiraga, Z. Zhu, T. Yao, J. Appl. Phys. 84, 3912 (1998), doi: 10.1063/1.368595
  • [12] H.D. Sun, T. Makino, N.T. Tuan, Y. Segawa, M. Kawasaki, A. Ohtomo, K. Tamura, H. Koinuma, Appl. Phys. Lett. 78, 2464 (2001), doi: 10.1063/1.1367300
  • [13] Y.P. Varshni, Physica 34, 1 (1967), doi: 10.1016/0031-8914(67)90062-6
  • [14] P. Lautenschlager, M. Garriga, S. Logothetidis, M. Cardona, Phys. Rev. B 35, 9174 (1987), doi: 10.1103/PhysRevB.35.9174

Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv130n511kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.