Elastic-Plastic Transition in MBE-Grown GaSb Semiconducting Crystal Examined by Nanoindentation

• Authors: A. Majtyka , M. Trębala , A. Tukiainen , D. Chrobak , W. Borgieł , J. Räisänen , R. Nowak
• Languages of publication: EN

Abstracts

EN

The present paper concerns the elastic-plastic nanodeformation of Te-doped GaSb crystals grown by molecular beam epitaxy on the n-type of GaSb substrate. The conventional analysis of nanoindentation data obtained with sharp triangular (Berkovich) and spherical tip revealed the elastic modulus (E=83.07± 1.78 GPa), hardness (H=5.19±0.25 GPa) and "true hardness" (H_{T}=5.73±0.04 GPa). The registered pop-in event which indicates the elastic-plastic transition in GaSb crystal points towards the corresponding yield strength (σ_{Y}=3.8±0.1 GPa). The origin of incipient plasticity in GaSb crystal is discussed in terms of elastic-plastic deformation energy concept.

Keywords

EN

81.40.Jj; 62.20.F-; 81.15.Hi; 81.05.Ea

Discipline

• 81.15.Hi: Molecular, atomic, ion, and chemical beam epitaxy
• 62.20.F-: Deformation and plasticity(see also 83.50.-v Deformation and flow in rheology; for materials treatment effects on deformation, see 81.40.Lm)
• 81.40.Jj: Elasticity and anelasticity, stress-strain relations
• 81.05.Ea: III-V semiconductors

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2016
• Volume: 130
• Issue: 4
• Pages: 1131-1133

Dates

published

2016-10

Contributors

author

A. Majtyka

• Nordic Hysitron Laboratory, Department of Materials Science and Engineering, Aalto University, 00076 Aalto, Finland

author

M. Trębala

• Nordic Hysitron Laboratory, Department of Materials Science and Engineering, Aalto University, 00076 Aalto, Finland

author

A. Tukiainen

• Optoelectronics Research Centre, Tampere University of Technology, 33101 Tampere, Finland

author

D. Chrobak

• Institute of Materials Science, University of Silesia, 75 Pułku Piechoty 1, 45-500 Chorzów, Poland

author

W. Borgieł

• Nordic Hysitron Laboratory, Department of Materials Science and Engineering, Aalto University, 00076 Aalto, Finland
• Institute of Physics, University of Silesia, 75 Pułku Piechoty 1, 45-500 Chorzów, Poland

author

J. Räisänen

• Department of Physics, University of Helsinki, P.O. Box 43, FI-00014, Helsinki, Finland

author

R. Nowak

• Nordic Hysitron Laboratory, Department of Materials Science and Engineering, Aalto University, 00076 Aalto, Finland

References

• [1] Y. Nagao, T. Hariu, Y. Shibata, IEEE Trans. Electron Dev. 28, 407 (1981), doi: 10.1109/T-ED.1981.20355
• [2] A.V. Zolotukhin, V.V. Sherstnev, K.S. Savelieva, E. Grebenshchikova, O.Yu. Serebrennikova, N.D. Ilinskaya, S.A. Slobozhanuk, E.V. Ivanov, Y.P. Yakovlev, J. Phys. Conf. Ser. 461, 1 (2013), doi: 10.1088/1742-6596/461/1/012036
• [3] A.W. Bett, O.V. Sulima, Semicond. Sci. Technol. 18, 184 (2003), doi: 10.1088/0268-1242/18/5/307
• [4] L. Du, I. Knez, G. Sullivan, R.-R. Du, Phys. Rev. Lett. 114, 096802 (2015), doi: 10.1103/PhysRevLett.114.096802
• [5] A.W. Dey, B.M. Borg, B. Ganjipour, M. Ek, K.A. Dick, E. Lind, C. Thelander, L.E. Wernersson, IEEE Electron. Dev. Lett. 34, 211 (2013), doi: 10.1109/LED2012.2234078
• [6] X. Li, T. Ono, Y. Wang, M. Esashi, Appl. Phys. Lett. 83, 3081 (2003), doi: 10.1063/1.1618369
• [7] R. Nowak, D. Chrobak, S. Nagao, D. Vodnick, M. Berg, A. Tukiainen, M. Pessa, Nat. Nanotechnol. 4, 287 (2009), doi: 10.1038/NNANO.2009.49
• [8] D. Chrobak, K.-H. Kim, J. Kurzydłowski, R. Nowak, Appl. Phys. Lett. 103, 072101 (2013), doi: 10.1063/1.4818260
• [9] D. Robidas, C. Arunseshan, K.R. Deepthi, D. Arivuolid, Int. J. Mech. Industr. Eng. 3, 2231 (2013)
• [10] W.C. Oliver, G.M. Pharr, J. Mater. Res. 7, 1564 (1992), doi: 10.1557/JMR.1992.1564
• [11] A.C. Fisher-Cripps, Mechanical Engineering Series. Nanoindentation, 2nd ed., Springer, New York 2004
• [12] J.L. Plaza, E. Diéguez, Phys. Status Solidi 174, 361 (1999), doi: 10.1002/(SICI)1521-396X(199908)174:2<361::AID-PSSA361>3.0.CO;2-R
• [13] M. Sakai, R. Nowak, in: Ceramics, Adding the Value, Vol. 2, Ed. M.J. Bannister, Australian Ceramics Society, Melbourne 1992, p. 922
• [14] M. Sakai, Acta Metall. Mater. 41, 1751 (1993), doi: 10.1016/0956-7151(93)90194-W
• [15] M. Fujikane, M. Leszczyński, S. Nagao, T. Nakayama, S. Yamanaka, K. Niihara, R. Nowak, J. Alloys Comp. 450, 405 (2008), doi: 10.1016/j.jallcom.2006.10.121
• [16] K.L. Johnson, Contact Mechanics, 9th ed., Cambridge University Press, Cambridge 2003
• [17] S. Pathak, S.R. Kalidindi, Mater. Sci. Eng. R 91, 1 (2015), doi: 10.1016/j.mser.2015.02.001
• [18] W. Tahar Belarbi, A. Rouabhia, F. Tair, B. Amrani, N. Sekkal, Int. J. Mod. Phys. B 29, 1550056 (2015), doi: 10.1142/S0217979215500563
• [19] S.G. Corcoran, R.J. Colton, E.T. Lilleodden, W.W. Gerberich, Phys. Rev. B 55, R16057 (1997), doi: 10.1103/PhysRevB.55.R16057

Identifiers

DOI

10.12693/APhysPolA.130.1131