Sharp-Rejection, Wide and Deep Stopband Low Pass Filter Design Using Open Stubs and DGS Patterns

• Authors: M. Challal , M. Boulakroune
• Languages of publication: EN

Abstracts

EN

A sharp rejection, wide and deep stopband microstrip low pass filter is investigated in this paper. The proposed low pass filter is composed of three defected ground structure patterns and four open stubs. Simulated results verify that the filter has a sharpness factor of 0.9, a low insertion loss of 0.65 and a return loss less than 15 dB. Moreover, a wide stopband at 20 dB rejection ranging from 4.55 GHz to 11.62 GHz is accomplished. The filter presented in this work was compared with the previous works completed on low pass filter with sharp rejection. It has shown that the filter provides good performances in terms of sharp rejection, wide and deep rejection band and small passband insertion loss compared to those reported in the literatures.

Keywords

EN

41.20.-q; 41.20.Jb; 11.10.-z

Discipline

• 41.20.Jb: Electromagnetic wave propagation; radiowave propagation(for light propagation, see 42.25.Bs; for electromagnetic waves in plasma, see 52.35.Hr; for atmospheric, ionospheric, and magnetospheric propagation, see 92.60.Ta, 94.20.Bb, and 94.30.Tz, respectively; see also 94.05.Pt Wave/wave, wave/particle interactions, in space plasma physics)
• 41.20.-q: Applied classical electromagnetism(for submillimeter wave, microwave, and radiowave instruments and equipment, see 07.57.-c)
• 11.10.-z: Field theory(for gauge field theories, see 11.15.-q)

• Journal: Acta Physica Polonica A
• Year: 2016
• Volume: 130
• Issue: 1
• Pages: 9-10

Dates

published

2016-07

Contributors

author

M. Challal

• University M'Hamed Bougara of Boumerdes, Institute of Electrical and Electronic Engineering, Signals and Systems Laboratory, Department of Electronics, Boumerdes, Algeria

author

M. Boulakroune

• University Kasdi Merbah of Ouargla, Faculty of New Technologies of Information and Communication, Electronics and Communication Department, Ouargla, Algeria

References

• [1] M. Challal, A. Boutejdar, Microwave Opt. Technol. Lett. 55, 122 (2013), doi: 10.1002/mop.27260
• [2] M. Challal, A. Boutejdar, ACES J. 27, 808 (2012)
• [3] Wang Huina, Li Guohui, Yan Jun, in: Proc. China-Japan Joint Microwave Conference (CJMW 2008), IEEE, Shanghai (China) 2008, p. 388, doi: 10.1109/CJMW.2008.4772452
• [4] J. Zhang, B. Cui, S. Lin, X.-W. Sun, Prog. Electromagn. Res. 69, 219 (2007), doi: 10.2528/PIER06122103
• [5] C.Y. Hung, M.H. Weng, R.Y. Yang, Microwave Opt. Technol. Lett. 50, 894 (2008), doi: 10.1002/mop.23224

Identifiers

DOI

10.12693/APhysPolA.130.9