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Number of results
2016 | 129 | 6 | 1178-1183

Article title

A Quantitative Approach for the Determination of Light Induced Defects in a-Se_{90}Sb_{10-x}Ag_x Thin Films by Using Thermally Stimulated Current Technique

Content

Title variants

Languages of publication

EN

Abstracts

EN
Thin films of Se_{90}Sb_{10-x}Ag_x (x=0, 2, 4, 6, 8) glasses have been prepared by vacuum evaporation technique. Present study reports the quantitative estimation of light induced defects in aforesaid thin films by using thermally stimulated current technique. Measurements have been made in a vacuum ≈10¯³ Torr before and after exposing amorphous films to white light for different exposure times (0 to 6 h). Results indicate that light induced defects are created due to prolonged exposure of light and this is explained by a microscopic model proposed by Shimakawa and co-workers. It is also found that fractional increase in light induced defect density decreases as Ag concentration increases. A discontinuity has, however, been observed at 4 at.% of Ag which is explained in terms of average coordination number.

Keywords

EN

Year

Volume

129

Issue

6

Pages

1178-1183

Physical description

Dates

published
2016-06
received
2015-08-22
(unknown)
2016-03-13

Contributors

author
  • Department of Physics, Harcourt Butler Technological Institute, Kanpur, India
author
  • Department of Physics, Panjab University, Chandigarh, India
author
  • Department of Physics, Harcourt Butler Technological Institute, Kanpur, India

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Document Type

Publication order reference

Identifiers

YADDA identifier

bwmeta1.element.bwnjournal-article-appv129n619kz
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