A Quantitative Approach for the Determination of Light Induced Defects in a-Se_{90}Sb_{10-x}Ag_x Thin Films by Using Thermally Stimulated Current Technique

• Authors: Anjani Kumar , S. Tripathi , A. Kumar
• Languages of publication: EN

Abstracts

EN

Thin films of Se_{90}Sb_{10-x}Ag_x (x=0, 2, 4, 6, 8) glasses have been prepared by vacuum evaporation technique. Present study reports the quantitative estimation of light induced defects in aforesaid thin films by using thermally stimulated current technique. Measurements have been made in a vacuum ≈10¯³ Torr before and after exposing amorphous films to white light for different exposure times (0 to 6 h). Results indicate that light induced defects are created due to prolonged exposure of light and this is explained by a microscopic model proposed by Shimakawa and co-workers. It is also found that fractional increase in light induced defect density decreases as Ag concentration increases. A discontinuity has, however, been observed at 4 at.% of Ag which is explained in terms of average coordination number.

Keywords

EN

71.55.Jv; 72.80.Ng

Discipline

• 72.80.Ng: Disordered solids
• 71.55.Jv: Disordered structures; amorphous and glassy solids

• Publisher: Institute of Physics, Polish Academy of Sciences
• Journal: Acta Physica Polonica A
• Year: 2016
• Volume: 129
• Issue: 6
• Pages: 1178-1183

Dates

published

2016-06

received

2015-08-22

(unknown)

2016-03-13

Contributors

author

Anjani Kumar

• Department of Physics, Harcourt Butler Technological Institute, Kanpur, India

author

S. Tripathi

• Department of Physics, Panjab University, Chandigarh, India

author

A. Kumar

• Department of Physics, Harcourt Butler Technological Institute, Kanpur, India

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Identifiers

DOI

10.12693/APhysPolA.129.1178