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2016 | 129 | 6 | 1178-1183
Article title

A Quantitative Approach for the Determination of Light Induced Defects in a-Se_{90}Sb_{10-x}Ag_x Thin Films by Using Thermally Stimulated Current Technique

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EN
Abstracts
EN
Thin films of Se_{90}Sb_{10-x}Ag_x (x=0, 2, 4, 6, 8) glasses have been prepared by vacuum evaporation technique. Present study reports the quantitative estimation of light induced defects in aforesaid thin films by using thermally stimulated current technique. Measurements have been made in a vacuum ≈10¯³ Torr before and after exposing amorphous films to white light for different exposure times (0 to 6 h). Results indicate that light induced defects are created due to prolonged exposure of light and this is explained by a microscopic model proposed by Shimakawa and co-workers. It is also found that fractional increase in light induced defect density decreases as Ag concentration increases. A discontinuity has, however, been observed at 4 at.% of Ag which is explained in terms of average coordination number.
Keywords
EN
Publisher

Year
Volume
129
Issue
6
Pages
1178-1183
Physical description
Dates
published
2016-06
received
2015-08-22
(unknown)
2016-03-13
Contributors
author
  • Department of Physics, Harcourt Butler Technological Institute, Kanpur, India
author
  • Department of Physics, Panjab University, Chandigarh, India
author
  • Department of Physics, Harcourt Butler Technological Institute, Kanpur, India
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Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv129n619kz
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