PL EN


Preferences help
enabled [disable] Abstract
Number of results
2016 | 129 | 4 | 656-660
Article title

Investigation of the Effect of Different Current Loads on the Arc-Erosion Performance of Electrical Contacts

Authors
Content
Title variants
Languages of publication
EN
Abstracts
EN
In this study, arc-erosion experiments using contactors were performed under inductive loads for up to 40000 switching operations to investigate the effect of different current loads on the arc-erosion performance of electrical contacts. Determination of the mass loss was performed after every 5000 operations. The arc-eroded surfaces were examined using scanning electron microscopy. The chemical composition near the arc was determined by energy dispersive X-ray spectroscopy. The results show that the contact surfaces are greatly affected by arc-erosion, resulting in mass loss due to material migration and/or evaporation. In addition, the arc-affected zones become bigger with the increase in the number of switching operations, especially at 20 A. However, electrical cleaning improves the contact performance by reducing the contact resistance due to breakdown of the non-conducting oxide films formed between 20000 and 25000 switching operations at 20 A. The stationary contacts experience major erosion, whereas the movable contacts suffered less contact erosion under each current load.
Keywords
EN
Contributors
author
  • Karadeniz Technical University, Department of Metallurgical and Materials Engineering, 61080 Trabzon, Turkey
author
  • Karadeniz Technical University, Department of Mechanical Engineering, 61080 Trabzon, Turkey
References
  • [1] M. Braunovic, N.K. Myshkin, V.V. Konchits, Electrical Contacts: Fundamentals, Applications and Technology, CRC Press, Florida 2006
  • [2] V. Gurevich, Electric Relays: Principles and Applications, CRC Press, Florida 2005
  • [3] P.G. Slade, Electrical Contacts: Principles and Applications, CRC Press, Florida 2014
  • [4] S. Biyik, F. Arslan, M. Aydin, J. Electron. Mater. 44, 457 (2015), doi: 10.1007/s11664-014-3399-4
  • [5] Q. Shi, J. Yang, W.X. Peng, J.Z. Dong, Y.Q. Chu, H. Tang, C.S. Li, RSC Adv. 5, 100472 (2015), doi: 10.1039/c5ra17786c
  • [6] F. Pons, M. Cherkaoui, I. Ilali, S. Dominiak, J. Electron. Mater. 39, 456 (2010), doi: 10.1007/s11664-010-1097-4
  • [7] S. Biyik, M. Aydin, Proc. IEEE 15th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Ghent 2014, p. 1, doi: 10.1109/EuroSimE.2014.6813836
  • [8] D. Wojcik-Grzybek, K. Frydman, P. Borkowski, Arch. Metall. Mater. 58, 1059 (2013), doi: 10.2478/amm-2013-0126
  • [9] J. Wang, D. Li, Y. Wang, J. Alloy. Compd. 582, 1 (2014), doi: 10.1016/j.jallcom.2013.07.196
  • [10] S. Biyik, M. Aydin, Acta Phys. Pol. A 127, 1255 (2015), doi: 10.12693/APhysPolA.127.1255
  • [11] S. Biyik, M. Aydin, Proc. Int. Conf. on High Performance and Optimum Design of Structures and Materials, (HPSM/OPTI), Ostend (2014), p. 189, doi: 10.2495/HPSM140171
Document Type
Publication order reference
Identifiers
YADDA identifier
bwmeta1.element.bwnjournal-article-appv129n4062kz
JavaScript is turned off in your web browser. Turn it on to take full advantage of this site, then refresh the page.