Electrochemical Impedance Spectroscopy Studies of HF CVD Diamond Films

• Authors: M. Kowalska , K. Fabisiak , A. Wrzyszczyński , M. Szybowicz , K. Paprocki
• Languages of publication: EN

Abstracts

EN

Diamond films were synthesized by a hot filament vapor deposition method using H₂/CH₄ gas mixtures. A Hioki impedance analyzer was used to study the dielectric properties of the deposited diamond films. The dielectric dispersion measurement yielded the real and imaginary parts of impedance of diamond films in the form of a Nyquist plot in a complex plane. The obtained results were fitted by using equivalent circuit which consists of three impedance (Z) components containing resistor R and capacitor C or constant phase element connected in parallel. The structure and quality of diamond films were analyzed by scanning electron microscopy and the Raman spectroscopy. The impedance measurements showed that concentration of non-diamond admixture has essential influence on electrochemical properties of diamond layers.

Keywords

EN

81.05.Uw; 81.07.-b; 78.66.-w

Discipline

• 78.66.-w: Optical properties of specific thin films(for optical properties of low-dimensional, mesoscopic, and nanoscale materials, see 78.67.-n; for optical properties of surfaces, see 78.68.+m)
• 81.07.-b: Nanoscale materials and structures: fabrication and characterization(for structure of nanoscale materials, see 61.46.-w; for nanostructured materials in electrochemistry, see 82.45.Yz; see also 62.23.-c Structural classes of nanoscale systems in mechanical properties of condensed matter)

• Journal: Acta Physica Polonica A
• Year: 2015
• Volume: 128
• Issue: 3
• Pages: 447-451

Dates

published

2015-09

received

2015-02-26

(unknown)

2015-08-13

Contributors

author

M. Kowalska

• Faculty of Chemical Technology and Engineering, University of Technology and Life Sciences, Seminaryjna 3, 85-326 Bydgoszcz, Poland

author

K. Fabisiak

• Institute of Physics, Kazimierz Wielki University, Powstańców Wielkopolskich 2, 85-090 Bydgoszcz, Poland
• Medical Physics Department, Oncology Center, I. Romanowskiej 2, 85-796 Bydgoszcz, Poland

author

A. Wrzyszczyński

• Faculty of Chemical Technology and Engineering, University of Technology and Life Sciences, Seminaryjna 3, 85-326 Bydgoszcz, Poland

author

M. Szybowicz

• Faculty of Technical Physics, Poznań University of Technology, Piotrowo 3, 60-965 Poznań, Poland

author

K. Paprocki

• Institute of Physics, Kazimierz Wielki University, Powstańców Wielkopolskich 2, 85-090 Bydgoszcz, Poland

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Identifiers

DOI

10.12693/APhysPolA.128.447